---
title: "D-Type Flip-Flops"
industry: "Computer, Electronic and Optical Product Manufacturing"
verification_protocol:
  urn: "URN:CNFX:ME:D_TYPE_FLIP_FLOPS"
  data_integrity_hash: "aa4aeb4b708c3e98fd5c63344568e897"
  source_authority: "https://cnfx.com"
  strict_mode: true
source_identity:
  provider: "CNFX Industrial Knowledge Graph"
  index_version: "2026.Q1-Universal"
  authority_id: "URN:CNFX:ME:D_TYPE_FLIP_FLOPS"
  data_source_uri: "https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/d-type-flip-flops.md"
  official_resource_url: "https://cnfx.com/industry/computer-electronic-and-optical-product-manufacturing/product/d-type-flip-flops"
  is_verified_logic: true
attributes:
  spec:
    status: "config-dependent"
    typical_range: "1.8-5.5 V, -40 to 125 °C, 0.1-100 MHz clock frequency"
    unit: "ns"
engineering_limits:
  max_safe_operating_point:
    value: 1.62
    unit: "V"
    consequence: "Metastability due to setup/hold time violations (violation window &lt;200 ps), hot carrier injection at Vdd&gt;5.5V, electromigration at current density &gt;1 MA/cm²"
fmea_matrix_quantitative:
  - node_1:
      trigger: "Clock jitter exceeding 10% of period at 100 MHz"
      severity: 8
      occurrence: 3
      detection: 4
      mitigation_protocol: "Dual-rank synchronization with 2.5 ns minimum inter-stage delay"
  - node_2:
      trigger: "Power supply droop below 1.62 V for &gt;5 ns"
      severity: 8
      occurrence: 3
      detection: 4
      mitigation_protocol: "On-die decoupling capacitance &gt;100 pF with local LDO regulation"
bom_nodes:
  data-input-d:
    type: "component"
    urn: "URN:CNFX:ME:DATA_INPUT_D"
    interface_type: "physical-logic-coupled"
  clock-input-clk:
    type: "component"
    urn: "URN:CNFX:ME:CLOCK_INPUT_CLK"
    interface_type: "physical-logic-coupled"
  output-q:
    type: "component"
    urn: "URN:CNFX:ME:OUTPUT_Q"
    interface_type: "physical-logic-coupled"
  complementary-output-q:
    type: "component"
    urn: "URN:CNFX:ME:COMPLEMENTARY_OUTPUT_Q"
    interface_type: "physical-logic-coupled"
manufacturing_compliance:
  - standard: "ISO 9001:2015 QUALITY MANAGEMENT SYSTEMS"
    scope: "Verified Engineering Specification"
url: "https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/d-type-flip-flops.md"
on_chain_sovereignty:
  contract_standard: "ERC-721-Industrial"
  metadata_hash: "aab415180d3202ee1aea936a1d1990746b65dfaba61e44388c91502f68d65a32"
  royalty_logic: "IPFS-CID-REQUIRED"
  mint_status: "logic-verified-ready"
version: "3.3.4-EXTREME-SOVEREIGN-WEB3"
---

# Industrial Specification: D-Type Flip-Flops

## 1. Technical Definition
Digital storage elements that capture and hold data on clock edges, used in PFDs for phase comparison.

## 2. Engineering Reasoning & Causal Matrix
> **Operational Intelligence**: Designed for **1.8-5.5 V, -40 to 125 °C, 0.1-100 MHz clock frequency**. Failure boundary: **Supply voltage &lt;1.62 V or &gt;5.75 V, junction temperature &gt;150 °C, clock edge rate &lt;1 V/ns**, Mechanism: **Metastability due to setup/hold time violations (violation window &lt;200 ps), hot carrier injection at Vdd&gt;5.5V, electromigration at current density &gt;1 MA/cm²**.

### 2.2 FMEA (Failure Mode & Effects Analysis)
| Event Trigger | Severity | Failure Mode | Mitigation Strategy |
| :--- | :--- | :--- | :--- |
| Clock jitter exceeding 10% of period at 100 MHz | 8 | Metastable state propagation causing PFD false lock | Dual-rank synchronization with 2.5 ns minimum inter-stage delay |
| Power supply droop below 1.62 V for &gt;5 ns | 8 | Data corruption during clock-to-Q propagation delay (3.2 ns typical) | On-die decoupling capacitance &gt;100 pF with local LDO regulation |

## 3. Key Technical Parameters
| Parameter | Value | Unit | Status |
| :--- | :--- | :--- | :--- |
| spec | Config-dependent | ns | Verified |

## 4. System BOM & Knowledge Routing
### Core Components (Recursive Links)

### Industrial DNA Context (De-duplicated)
**Complementary Dependencies**: **Wafer Prober**, **Wire Bonder**, **Burn-in Test System**  
**Downstream Applications**: Microprocessors, FPGA Chips, Digital Signal Processors  

## 5. Engineering Risks & FAQ
- **Caution**: 
- **Caution**: 
- **Caution**: 

### Q: What is the primary function of D-Type Flip-Flops in phase frequency detectors?
**A**: D-Type Flip-Flops serve as digital storage elements in Phase Frequency Detectors (PFDs) to capture and compare input signal phases on clock edges, enabling precise phase comparison for synchronization in electronic systems.

### Q: How do the D and CLK inputs work together in D-Type Flip-Flops?
**A**: The Data Input (D) determines the value to be stored, while the Clock Input (CLK) triggers the capture of this data on its rising or falling edge. The stored value then appears at Output (Q) and its complement at Q̅.

### Q: Why are D-Type Flip-Flops manufactured using silicon?
**A**: Silicon provides excellent semiconductor properties for CMOS fabrication, enabling reliable, low-power operation with high switching speeds and integration density—essential for computer and optical product manufacturing applications.

## 6. Manufacturing Compliance
- ISO 9001:2015 QUALITY MANAGEMENT SYSTEMS

---
### 🛠️ Engineering Resource Access
🔗 **[Full Specification: D-Type Flip-Flops](https://cnfx.com/industry/computer-electronic-and-optical-product-manufacturing/product/d-type-flip-flops)**

### 🌐 Knowledge Graph Topology
> **Node Status**: Verified Engineering Spec
> **Connectivity**: Linked to **4** standalone system nodes
> **Global Context**: Part of a 5,814 node industrial cluster within the CNFX Graph

> **Reference ID**: D_TYPE_FLIP_FLOPS | **Authority**: CNFX-2026-ST-001 | **Fingerprint**: 5e05cf3c
