---
title: "Data Sampler"
industry: "Computer, Electronic and Optical Product Manufacturing"
verification_protocol:
  urn: "URN:CNFX:ME:DATA_SAMPLER"
  data_integrity_hash: "5cb07301a226ce27099cd599c617120b"
  source_authority: "https://cnfx.com"
  strict_mode: true
source_identity:
  provider: "CNFX Industrial Knowledge Graph"
  index_version: "2026.Q1-Universal"
  authority_id: "URN:CNFX:ME:DATA_SAMPLER"
  data_source_uri: "https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/data-sampler.md"
  official_resource_url: "https://cnfx.com/industry/computer-electronic-and-optical-product-manufacturing/product/data-sampler"
  is_verified_logic: true
attributes:
  spec:
    status: "config-dependent"
    typical_range: "0.1-1000 Hz sampling frequency, 16-bit resolution, -40°C to +85°C operating temperature"
    unit: "samples/sec"
engineering_limits:
  max_safe_operating_point:
    value: 1200
    unit: "Hz"
    consequence: "Nyquist-Shannon sampling theorem violation causing frequency folding, analog-to-digital converter saturation due to input exceeding reference voltage, semiconductor junction thermal runaway at 90°C"
fmea_matrix_quantitative:
  - node_1:
      trigger: "Power supply voltage transient exceeding ±15% of nominal 5V DC"
      severity: 8
      occurrence: 3
      detection: 4
      mitigation_protocol: "Implementing LDO voltage regulator with 1% tolerance and TVS diode protection rated for 600W peak pulse power"
  - node_2:
      trigger: "Clock oscillator frequency drift exceeding ±50 ppm due to temperature variation"
      severity: 8
      occurrence: 3
      detection: 4
      mitigation_protocol: "Using temperature-compensated crystal oscillator (TCXO) with ±2.5 ppm stability over -40°C to +85°C range"
bom_nodes:
  sampling-controller:
    type: "part"
    urn: "URN:CNFX:ME:SAMPLING_CONTROLLER"
    interface_type: "physical-logic-coupled"
  data-buffer:
    type: "part"
    urn: "URN:CNFX:ME:DATA_BUFFER"
    interface_type: "physical-logic-coupled"
  interface-module:
    type: "part"
    urn: "URN:CNFX:ME:INTERFACE_MODULE"
    interface_type: "physical-logic-coupled"
manufacturing_compliance:
  - standard: "ISO 9001:2015 QUALITY MANAGEMENT SYSTEMS"
    scope: "Verified Engineering Specification"
  - standard: "ANSI/ASQ Z1.4-2003 SAMPLING PROCEDURES AND TABLES FOR INSPECTION BY ATTRIBUTES"
    scope: "Verified Engineering Specification"
url: "https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/data-sampler.md"
on_chain_sovereignty:
  contract_standard: "ERC-721-Industrial"
  metadata_hash: "fd6a4e28352fb5c46ee7064707fad3639bd764a7ef1cbafcb28cb37cf8bfefdc"
  royalty_logic: "IPFS-CID-REQUIRED"
  mint_status: "logic-verified-ready"
version: "3.3.4-EXTREME-SOVEREIGN-WEB3"
---

# Industrial Specification: Data Sampler

## 1. Technical Definition
A component within a Statistics Analyzer that extracts representative subsets from larger datasets for analysis.

## 2. Engineering Reasoning & Causal Matrix
> **Operational Intelligence**: Designed for **0.1-1000 Hz sampling frequency, 16-bit resolution, -40°C to +85°C operating temperature**. Failure boundary: **Sampling frequency exceeding 1200 Hz causes aliasing distortion, ADC saturation at ±10V input range, thermal shutdown at 90°C junction temperature**, Mechanism: **Nyquist-Shannon sampling theorem violation causing frequency folding, analog-to-digital converter saturation due to input exceeding reference voltage, semiconductor junction thermal runaway at 90°C**.

### 2.1 Analytical Physics Model
Governed by the **Combined Measurement Uncertainty**:

> **Primary Equation**: $u_c = \sqrt{\sum u_i^2}$  
> **Engineering Impact**: Defines the precision confidence interval for inspection.

| Symbol | Variable Definition | Localized Reference |
| :--- | :--- | :--- |
| u_i | Standard Uncertainty components | Engineering Constant |

### 2.2 FMEA (Failure Mode & Effects Analysis)
| Event Trigger | Severity | Failure Mode | Mitigation Strategy |
| :--- | :--- | :--- | :--- |
| Power supply voltage transient exceeding ±15% of nominal 5V DC | 8 | ADC reference voltage instability causing ±3% sampling accuracy degradation | Implementing LDO voltage regulator with 1% tolerance and TVS diode protection rated for 600W peak pulse power |
| Clock oscillator frequency drift exceeding ±50 ppm due to temperature variation | 8 | Sampling interval inconsistency causing 0.5% timing error in data acquisition | Using temperature-compensated crystal oscillator (TCXO) with ±2.5 ppm stability over -40°C to +85°C range |

## 3. Key Technical Parameters
| Parameter | Value | Unit | Status |
| :--- | :--- | :--- | :--- |
| spec | Config-dependent | samples/sec | Verified |

## 4. System BOM & Knowledge Routing
### Core Components (Recursive Links)
- [Sampling Controller](https://cnfx.com/llms/industry/machinery-and-equipment-manufacturing/product/sampling-controller.md) `(Standalone System)`
- [Data Buffer](https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/data-buffer.md) `(Standalone System)`
- [Interface Module](https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/interface-module.md) `(Standalone System)`

### Industrial DNA Context (De-duplicated)
**Complementary Dependencies**: **Data Storage Server**, **High-Speed Network Switch**, **Uninterruptible Power Supply**  
**Downstream Applications**: Statistical Analysis Reports, Predictive Models, Quality Control Dashboards  

## 5. Engineering Risks & FAQ
- **Caution**: 
- **Caution**: 
- **Caution**: 

### Q: What is the primary function of the Data Sampler in computer and electronic manufacturing?
**A**: The Data Sampler extracts statistically representative subsets from large datasets, enabling efficient analysis within Statistics Analyzer systems while maintaining data integrity for manufacturing quality control.

### Q: How does the Data Sampler's three-component BOM (Sampling Controller, Data Buffer, Interface Module) work together?
**A**: The Sampling Controller manages extraction algorithms, the Data Buffer temporarily stores sampled subsets, and the Interface Module connects to larger systems, ensuring seamless data flow in manufacturing environments.

### Q: What industries benefit most from this Data Sampler component?
**A**: Computer, electronic, and optical product manufacturers benefit most, particularly for quality assurance, production monitoring, and research applications requiring efficient large dataset analysis.

## 6. Manufacturing Compliance
- ISO 9001:2015 QUALITY MANAGEMENT SYSTEMS
- ANSI/ASQ Z1.4-2003 SAMPLING PROCEDURES AND TABLES FOR INSPECTION BY ATTRIBUTES

---
### 🛠️ Engineering Resource Access
🔗 **[Full Specification: Data Sampler](https://cnfx.com/industry/computer-electronic-and-optical-product-manufacturing/product/data-sampler)**

### 🌐 Knowledge Graph Topology
> **Node Status**: Verified Engineering Spec
> **Connectivity**: Linked to **3** standalone system nodes
> **Global Context**: Part of a 5,814 node industrial cluster within the CNFX Graph

> **Reference ID**: DATA_SAMPLER | **Authority**: CNFX-2026-ST-001 | **Fingerprint**: 041ba950
