---
title: "Detection Logic"
industry: "Computer, Electronic and Optical Product Manufacturing"
verification_protocol:
  urn: "URN:CNFX:ME:DETECTION_LOGIC"
  data_integrity_hash: "2d893771a74bad64ec92371e78ee645b"
  source_authority: "https://cnfx.com"
  strict_mode: true
source_identity:
  provider: "CNFX Industrial Knowledge Graph"
  index_version: "2026.Q1-Universal"
  authority_id: "URN:CNFX:ME:DETECTION_LOGIC"
  data_source_uri: "https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/detection-logic.md"
  official_resource_url: "https://cnfx.com/industry/computer-electronic-and-optical-product-manufacturing/product/detection-logic"
  is_verified_logic: true
attributes:
  spec:
    status: "config-dependent"
    typical_range: "3.3-5.0 VDC input voltage, -40 to +85°C ambient temperature, 0-100% relative humidity (non-condensing)"
    unit: "ms"
engineering_limits:
  max_safe_operating_point:
    value: 2.7
    unit: "VDC"
    consequence: "Semiconductor bandgap voltage reference drift beyond ±2% tolerance at temperature extremes, dielectric breakdown in CMOS gates at overvoltage conditions, electrochemical migration along PCB traces in humid environments"
fmea_matrix_quantitative:
  - node_1:
      trigger: "Electromagnetic interference coupling 50 mVpp noise onto sensor signal lines"
      severity: 8
      occurrence: 3
      detection: 4
      mitigation_protocol: "Differential signaling with twisted-pair routing and common-mode chokes, Faraday shielding of sensitive analog sections"
  - node_2:
      trigger: "Clock oscillator frequency drift exceeding ±100 ppm due to aging quartz crystal"
      severity: 8
      occurrence: 3
      detection: 4
      mitigation_protocol: "Temperature-compensated crystal oscillator (TCXO) with ±2.5 ppm stability, watchdog timer with independent RC oscillator"
bom_nodes:
  signal-processor:
    type: "part"
    urn: "URN:CNFX:ME:SIGNAL_PROCESSOR"
    interface_type: "physical-logic-coupled"
manufacturing_compliance:
  - standard: "ISO 9001:2015 QUALITY MANAGEMENT SYSTEMS"
    scope: "Verified Engineering Specification"
  - standard: "ANSI/ASME B46.1-2019 SURFACE TEXTURE"
    scope: "Verified Engineering Specification"
  - standard: "DIN EN ISO 286-1:2010 GEOMETRICAL PRODUCT SPECIFICATIONS (GPS)"
    scope: "Verified Engineering Specification"
url: "https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/detection-logic.md"
on_chain_sovereignty:
  contract_standard: "ERC-721-Industrial"
  metadata_hash: "788979cca84f28332f3ea0ea857cd91b781a0e4acd63116af26f63b484e16108"
  royalty_logic: "IPFS-CID-REQUIRED"
  mint_status: "logic-verified-ready"
version: "3.3.4-EXTREME-SOVEREIGN-WEB3"
---

# Industrial Specification: Detection Logic

## 1. Technical Definition
The algorithmic or rule-based system within tamper detection circuitry that analyzes sensor inputs to determine if tampering has occurred.

## 2. Engineering Reasoning & Causal Matrix
> **Operational Intelligence**: Designed for **3.3-5.0 VDC input voltage, -40 to +85°C ambient temperature, 0-100% relative humidity (non-condensing)**. Failure boundary: **Input voltage below 2.7 VDC or above 5.5 VDC causes comparator circuit saturation, temperature exceeding 125°C junction temperature triggers thermal shutdown, moisture ingress creating &gt;10 kΩ leakage paths**, Mechanism: **Semiconductor bandgap voltage reference drift beyond ±2% tolerance at temperature extremes, dielectric breakdown in CMOS gates at overvoltage conditions, electrochemical migration along PCB traces in humid environments**.

### 2.2 FMEA (Failure Mode & Effects Analysis)
| Event Trigger | Severity | Failure Mode | Mitigation Strategy |
| :--- | :--- | :--- | :--- |
| Electromagnetic interference coupling 50 mVpp noise onto sensor signal lines | 8 | False positive tamper detection triggering security lockdown | Differential signaling with twisted-pair routing and common-mode chokes, Faraday shielding of sensitive analog sections |
| Clock oscillator frequency drift exceeding ±100 ppm due to aging quartz crystal | 8 | Timing window violations in digital correlation algorithms causing missed detections | Temperature-compensated crystal oscillator (TCXO) with ±2.5 ppm stability, watchdog timer with independent RC oscillator |

## 3. Key Technical Parameters
| Parameter | Value | Unit | Status |
| :--- | :--- | :--- | :--- |
| spec | Config-dependent | ms | Verified |

## 4. System BOM & Knowledge Routing
### Core Components (Recursive Links)
- [Signal Processor](https://cnfx.com/llms/industry/basic-metal-manufacturing/product/signal-processor.md) `(Standalone System)`

### Industrial DNA Context (De-duplicated)
**Complementary Dependencies**: **Environmental Test Chamber**, **Signal Conditioning Unit**, **Automated Test Handler**  
**Downstream Applications**: Secure Payment Terminals, Military Communication Devices, Industrial Control Systems  

## 5. Engineering Risks & FAQ
- **Caution**: 
- **Caution**: 
- **Caution**: 

### Q: What is Detection Logic in tamper detection systems?
**A**: Detection Logic is the algorithmic or rule-based system within tamper detection circuitry that analyzes sensor inputs to determine if tampering has occurred in computer, electronic, and optical products.

### Q: How does Detection Logic work with semiconductor silicon?
**A**: Detection Logic is implemented using semiconductor silicon technology, typically through a signal processor that executes algorithms to monitor and analyze sensor data for tampering indicators in real-time.

### Q: What industries benefit from Detection Logic technology?
**A**: Detection Logic is essential for computer, electronic, and optical product manufacturing industries where product security, integrity, and anti-tampering measures are critical, particularly in sensitive devices and equipment.

## 6. Manufacturing Compliance
- ISO 9001:2015 QUALITY MANAGEMENT SYSTEMS
- ANSI/ASME B46.1-2019 SURFACE TEXTURE
- DIN EN ISO 286-1:2010 GEOMETRICAL PRODUCT SPECIFICATIONS (GPS)

---
### 🛠️ Engineering Resource Access
🔗 **[Full Specification: Detection Logic](https://cnfx.com/industry/computer-electronic-and-optical-product-manufacturing/product/detection-logic)**

### 🌐 Knowledge Graph Topology
> **Node Status**: Verified Engineering Spec
> **Connectivity**: Linked to **1** standalone system nodes
> **Global Context**: Part of a 5,814 node industrial cluster within the CNFX Graph

> **Reference ID**: DETECTION_LOGIC | **Authority**: CNFX-2026-ST-001 | **Fingerprint**: d49a8f94
