---
title: "Electrical Test Fixture"
industry: "Computer, Electronic and Optical Product Manufacturing"
verification_protocol:
  urn: "URN:CNFX:ME:ELECTRICAL_TEST_FIXTURE"
  data_integrity_hash: "84f91215534f6b0e94f5d2d95b2fac23"
  source_authority: "https://cnfx.com"
  strict_mode: true
source_identity:
  provider: "CNFX Industrial Knowledge Graph"
  index_version: "2026.Q1-Universal"
  authority_id: "URN:CNFX:ME:ELECTRICAL_TEST_FIXTURE"
  data_source_uri: "https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/electrical-test-fixture.md"
  official_resource_url: "https://cnfx.com/industry/computer-electronic-and-optical-product-manufacturing/product/electrical-test-fixture"
  is_verified_logic: true
attributes:
  spec:
    status: "config-dependent"
    typical_range: "0-1000 VDC, 0-100 A, -40°C to +125°C"
    unit: "mm"
engineering_limits:
  max_safe_operating_point:
    value: 1500
    unit: "VDC"
    consequence: "Dielectric breakdown of insulation materials (PEEK/PTFE) at 15 kV/mm, contact oxidation forming Cu2O/CuO layers, thermoplastic creep above glass transition temperature"
fmea_matrix_quantitative:
  - node_1:
      trigger: "Electrochemical migration from ionic contamination"
      severity: 8
      occurrence: 3
      detection: 4
      mitigation_protocol: "Conformal coating with 25 μm parylene-C, ionic cleanliness control below 1.56 μg/cm² NaCl equivalent"
  - node_2:
      trigger: "Contact fretting wear at 10 μm amplitude"
      severity: 8
      occurrence: 3
      detection: 4
      mitigation_protocol: "Gold plating (0.76 μm min) over nickel barrier (2.54 μm), contact force maintained at 50-100 g per pin"
bom_nodes:
  contact-probe-array:
    type: "part"
    urn: "URN:CNFX:ME:CONTACT_PROBE_ARRAY"
    interface_type: "physical-logic-coupled"
  fixture-plate:
    type: "component"
    urn: "URN:CNFX:ME:FIXTURE_PLATE"
    interface_type: "physical-logic-coupled"
  interface-connector:
    type: "component"
    urn: "URN:CNFX:ME:INTERFACE_CONNECTOR"
    interface_type: "physical-logic-coupled"
manufacturing_compliance:
url: "https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/electrical-test-fixture.md"
on_chain_sovereignty:
  contract_standard: "ERC-721-Industrial"
  metadata_hash: "e659f5333f9e77f5589bfd4f083290eb0c3385106ea64f2709c995336a762ed2"
  royalty_logic: "IPFS-CID-REQUIRED"
  mint_status: "logic-verified-ready"
version: "3.3.4-EXTREME-SOVEREIGN-WEB3"
---

# Industrial Specification: Electrical Test Fixture

## 1. Technical Definition
A specialized device used to securely hold and electrically connect electronic components or assemblies during testing procedures.

## 2. Engineering Reasoning & Causal Matrix
> **Operational Intelligence**: Designed for **0-1000 VDC, 0-100 A, -40°C to +125°C**. Failure boundary: **Dielectric breakdown at 1500 VDC, contact resistance exceeding 50 mΩ, thermal deformation at 150°C**, Mechanism: **Dielectric breakdown of insulation materials (PEEK/PTFE) at 15 kV/mm, contact oxidation forming Cu2O/CuO layers, thermoplastic creep above glass transition temperature**.

### 2.1 Analytical Physics Model
Governed by the **Combined Measurement Uncertainty**:

> **Primary Equation**: $u_c = \sqrt{\sum u_i^2}$  
> **Engineering Impact**: Defines the precision confidence interval for inspection.

| Symbol | Variable Definition | Localized Reference |
| :--- | :--- | :--- |
| u_i | Standard Uncertainty components | Engineering Constant |

### 2.2 FMEA (Failure Mode & Effects Analysis)
| Event Trigger | Severity | Failure Mode | Mitigation Strategy |
| :--- | :--- | :--- | :--- |
| Electrochemical migration from ionic contamination | 8 | Short circuit between adjacent test points | Conformal coating with 25 μm parylene-C, ionic cleanliness control below 1.56 μg/cm² NaCl equivalent |
| Contact fretting wear at 10 μm amplitude | 8 | Intermittent electrical connection with &gt;100 mΩ resistance | Gold plating (0.76 μm min) over nickel barrier (2.54 μm), contact force maintained at 50-100 g per pin |

## 3. Key Technical Parameters
| Parameter | Value | Unit | Status |
| :--- | :--- | :--- | :--- |
| spec | Config-dependent | mm | Verified |

## 4. System BOM & Knowledge Routing
### Core Components (Recursive Links)
- [Contact Probe Array](https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/contact-probe-array.md) `(Standalone System)`

### Industrial DNA Context (De-duplicated)
**Complementary Dependencies**: **Automated Test Equipment (ATE)**, **Environmental Test Chamber**, **Precision Power Supply**  
**Downstream Applications**: Printed Circuit Board Assemblies (PCBAs), Semiconductor Devices, Electronic Control Units (ECUs)  

## 5. Engineering Risks & FAQ
- **Caution**: 
- **Caution**: 
- **Caution**: 

### Q: What materials are used in this electrical test fixture?
**A**: This fixture uses phosphor bronze for contact pins (ensuring reliable electrical connections), FR-4 for the PCB substrate (providing stability and insulation), and aluminum alloy for the housing (offering durability and heat dissipation).

### Q: What components are included in the BOM for this test fixture?
**A**: The bill of materials includes a Contact Probe Array for electrical interfacing, a Fixture Plate for secure component mounting, and an Interface Connector for system integration with testing equipment.

### Q: What industries typically use this type of electrical test fixture?
**A**: This fixture is designed for computer, electronic, and optical product manufacturing, where it's used to test components like circuit boards, sensors, and optical assemblies during quality control and production verification.

## 6. Manufacturing Compliance

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### 🛠️ Engineering Resource Access
🔗 **[Full Specification: Electrical Test Fixture](https://cnfx.com/industry/computer-electronic-and-optical-product-manufacturing/product/electrical-test-fixture)**

### 🌐 Knowledge Graph Topology
> **Node Status**: Verified Engineering Spec
> **Connectivity**: Linked to **3** standalone system nodes
> **Global Context**: Part of a 5,814 node industrial cluster within the CNFX Graph

> **Reference ID**: ELECTRICAL_TEST_FIXTURE | **Authority**: CNFX-2026-ST-001 | **Fingerprint**: 852fed08
