---
title: "Entrance Slit"
industry: "Computer, Electronic and Optical Product Manufacturing"
verification_protocol:
  urn: "URN:CNFX:ME:ENTRANCE_SLIT"
  data_integrity_hash: "699c20bcd3cfd1155101643006a22438"
  source_authority: "https://cnfx.com"
  strict_mode: true
source_identity:
  provider: "CNFX Industrial Knowledge Graph"
  index_version: "2026.Q1-Universal"
  authority_id: "URN:CNFX:ME:ENTRANCE_SLIT"
  data_source_uri: "https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/entrance-slit.md"
  official_resource_url: "https://cnfx.com/industry/computer-electronic-and-optical-product-manufacturing/product/entrance-slit"
  is_verified_logic: true
attributes:
  spec:
    status: "config-dependent"
    typical_range: "0.5-200 μm slit width, 0.1 μm resolution, 0.5-5 mm slit height, ±0.05 μm alignment tolerance"
    unit: "μm"
engineering_limits:
  max_safe_operating_point:
    value: 0.5
    unit: "N"
    consequence: "Thermal expansion mismatch between Invar blades (α=1.2×10⁻⁶ K⁻¹) and aluminum frame (α=23×10⁻⁶ K⁻¹) causing binding at ΔT&gt;15°C; piezoelectric actuator hysteresis &gt;3% at &gt;1000 cycles"
fmea_matrix_quantitative:
  - node_1:
      trigger: "Ambient temperature fluctuation &gt;10°C/hour"
      severity: 8
      occurrence: 3
      detection: 4
      mitigation_protocol: "Active temperature stabilization to ±0.1°C using Peltier elements with PID control"
  - node_2:
      trigger: "Piezoelectric actuator voltage ripple &gt;50 mVpp at 100 Hz"
      severity: 8
      occurrence: 3
      detection: 4
      mitigation_protocol: "Low-noise linear amplifier with &lt;5 mVpp ripple and EMI shielding at 40 dB attenuation"
bom_nodes:
  fixed-jaw:
    type: "component"
    urn: "URN:CNFX:ME:FIXED_JAW"
    interface_type: "physical-logic-coupled"
  movable-jaw:
    type: "component"
    urn: "URN:CNFX:ME:MOVABLE_JAW"
    interface_type: "physical-logic-coupled"
  adjustment-mechanism:
    type: "part"
    urn: "URN:CNFX:ME:ADJUSTMENT_MECHANISM"
    interface_type: "physical-logic-coupled"
  slit-mounthousing:
    type: "part"
    urn: "URN:CNFX:ME:SLIT_MOUNTHOUSING"
    interface_type: "physical-logic-coupled"
manufacturing_compliance:
  - standard: "ISO 286-2:2010 (GEOMETRICAL PRODUCT SPECIFICATIONS - LIMITS AND FITS)"
    scope: "Verified Engineering Specification"
  - standard: "ANSI/ASME B46.1-2019 (SURFACE TEXTURE)"
    scope: "Verified Engineering Specification"
url: "https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/entrance-slit.md"
on_chain_sovereignty:
  contract_standard: "ERC-721-Industrial"
  metadata_hash: "29c90591af0af2f7c7353db9754506492f47e2b7548567411eec3189d850e903"
  royalty_logic: "IPFS-CID-REQUIRED"
  mint_status: "logic-verified-ready"
version: "3.3.4-EXTREME-SOVEREIGN-WEB3"
---

# Industrial Specification: Entrance Slit

## 1. Technical Definition
A precisely adjustable aperture that controls the width and alignment of light entering a spectrometer.

## 2. Engineering Reasoning & Causal Matrix
> **Operational Intelligence**: Designed for **0.5-200 μm slit width, 0.1 μm resolution, 0.5-5 mm slit height, ±0.05 μm alignment tolerance**. Failure boundary: **Slit width deviation &gt;0.2 μm from setpoint, alignment offset &gt;0.1 μm, blade contact force &gt;0.5 N**, Mechanism: **Thermal expansion mismatch between Invar blades (α=1.2×10⁻⁶ K⁻¹) and aluminum frame (α=23×10⁻⁶ K⁻¹) causing binding at ΔT&gt;15°C; piezoelectric actuator hysteresis &gt;3% at &gt;1000 cycles**.

### 2.1 Analytical Physics Model
Governed by the **Rayleigh Resolution Criterion**:

> **Primary Equation**: $d = \frac{0.61 \lambda}{NA}$  
> **Engineering Impact**: Defines the theoretical limit of machine vision systems.

| Symbol | Variable Definition | Localized Reference |
| :--- | :--- | :--- |
| \lambda | Wavelength | Engineering Constant |
| NA | Numerical Aperture | Engineering Constant |

### 2.2 FMEA (Failure Mode & Effects Analysis)
| Event Trigger | Severity | Failure Mode | Mitigation Strategy |
| :--- | :--- | :--- | :--- |
| Ambient temperature fluctuation &gt;10°C/hour | 8 | Slit width drift &gt;0.15 μm due to differential thermal expansion | Active temperature stabilization to ±0.1°C using Peltier elements with PID control |
| Piezoelectric actuator voltage ripple &gt;50 mVpp at 100 Hz | 8 | Positional jitter &gt;0.05 μm RMS causing spectral line broadening | Low-noise linear amplifier with &lt;5 mVpp ripple and EMI shielding at 40 dB attenuation |

## 3. Key Technical Parameters
| Parameter | Value | Unit | Status |
| :--- | :--- | :--- | :--- |
| spec | Config-dependent | μm | Verified |

## 4. System BOM & Knowledge Routing
### Core Components (Recursive Links)
- [Adjustment Mechanism](https://cnfx.com/llms/industry/machinery-and-equipment-manufacturing/product/adjustment-mechanism.md) `(Standalone System)`
- [Slit Mount/Housing](https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/slit-mounthousing.md) `(Standalone System)`

### Industrial DNA Context (De-duplicated)
**Complementary Dependencies**: **Spectrometer Optical Bench**, **Precision Alignment Laser**, **Clean Room Air Filtration System**  
**Downstream Applications**: UV-Vis Spectrometers, Raman Spectroscopy Systems, Mass Spectrometry Instruments  

## 5. Engineering Risks & FAQ
- **Caution**: 
- **Caution**: 
- **Caution**: 

### Q: What materials are available for entrance slits and what are their applications?
**A**: Our entrance slits are available in stainless steel for general use, tungsten for high-temperature environments, and quartz for UV spectroscopy applications requiring transparency to ultraviolet light.

### Q: How does the adjustment mechanism work on your entrance slits?
**A**: The adjustment mechanism uses a precision micrometer or motorized system to move the movable jaw relative to the fixed jaw, allowing exact control of slit width from microns to millimeters with repeatable accuracy.

### Q: What factors affect the performance of an entrance slit in a spectrometer?
**A**: Key performance factors include slit width precision (affects spectral resolution), edge straightness and parallelism (affects light throughput), material durability (for consistent performance), and alignment stability within the slit mount/housing.

## 6. Manufacturing Compliance
- ISO 286-2:2010 (GEOMETRICAL PRODUCT SPECIFICATIONS - LIMITS AND FITS)
- ANSI/ASME B46.1-2019 (SURFACE TEXTURE)

---
### 🛠️ Engineering Resource Access
🔗 **[Full Specification: Entrance Slit](https://cnfx.com/industry/computer-electronic-and-optical-product-manufacturing/product/entrance-slit)**

### 🌐 Knowledge Graph Topology
> **Node Status**: Verified Engineering Spec
> **Connectivity**: Linked to **4** standalone system nodes
> **Global Context**: Part of a 5,814 node industrial cluster within the CNFX Graph

> **Reference ID**: ENTRANCE_SLIT | **Authority**: CNFX-2026-ST-001 | **Fingerprint**: dcaadcde
