---
title: "Latch/Flip-Flop"
industry: "Computer, Electronic and Optical Product Manufacturing"
verification_protocol:
  urn: "URN:CNFX:ME:LATCHFLIP_FLOP"
  data_integrity_hash: "58bc5741b3c4e210809626e9c52d87f6"
  source_authority: "https://cnfx.com"
  strict_mode: true
source_identity:
  provider: "CNFX Industrial Knowledge Graph"
  index_version: "2026.Q1-Universal"
  authority_id: "URN:CNFX:ME:LATCHFLIP_FLOP"
  data_source_uri: "https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/latchflip-flop.md"
  official_resource_url: "https://cnfx.com/industry/computer-electronic-and-optical-product-manufacturing/product/latchflip-flop"
  is_verified_logic: true
attributes:
  spec:
    status: "config-dependent"
    typical_range: "0.8-5.5 V (CMOS), -0.5 to 7.0 V (absolute maximum ratings)"
    unit: "ns"
engineering_limits:
  max_safe_operating_point:
    value: 7.0
    unit: "V"
    consequence: "Dielectric breakdown of silicon dioxide gate insulator (SiO₂) at 10 MV/cm field strength, with electron tunneling initiating at 6.5 V across 6.5 nm oxide thickness"
fmea_matrix_quantitative:
  - node_1:
      trigger: "Clock signal metastability with setup time violation below 150 ps at 100 MHz operation"
      severity: 8
      occurrence: 3
      detection: 4
      mitigation_protocol: "Dual-rank synchronizer with 2-stage flip-flop chain and 300 ps minimum setup time margin"
  - node_2:
      trigger: "Electrostatic discharge (ESD) event exceeding 2 kV HBM (Human Body Model)"
      severity: 8
      occurrence: 3
      detection: 4
      mitigation_protocol: "Integrated ESD protection diodes clamping at 5.5 V with 1.5 Ω series resistance"
bom_nodes:
  transistor-gates:
    type: "component"
    urn: "URN:CNFX:ME:TRANSISTOR_GATES"
    interface_type: "physical-logic-coupled"
  interconnects:
    type: "component"
    urn: "URN:CNFX:ME:INTERCONNECTS"
    interface_type: "physical-logic-coupled"
  substrate:
    type: "component"
    urn: "URN:CNFX:ME:SUBSTRATE"
    interface_type: "physical-logic-coupled"
manufacturing_compliance:
  - standard: "ISO 9001:2015 - QUALITY MANAGEMENT SYSTEMS"
    scope: "Verified Engineering Specification"
url: "https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/latchflip-flop.md"
on_chain_sovereignty:
  contract_standard: "ERC-721-Industrial"
  metadata_hash: "148813a2ff3a02a1c6148bb3dacd83728613016bd8b5d46894e48abb747620af"
  royalty_logic: "IPFS-CID-REQUIRED"
  mint_status: "logic-verified-ready"
version: "3.3.4-EXTREME-SOVEREIGN-WEB3"
---

# Industrial Specification: Latch/Flip-Flop

## 1. Technical Definition
A digital logic circuit that stores one bit of data, maintaining its state until changed by an input signal.

## 2. Engineering Reasoning & Causal Matrix
> **Operational Intelligence**: Designed for **0.8-5.5 V (CMOS), -0.5 to 7.0 V (absolute maximum ratings)**. Failure boundary: **Input voltage exceeding 7.0 V causes gate oxide breakdown at 10 MV/cm electric field strength**, Mechanism: **Dielectric breakdown of silicon dioxide gate insulator (SiO₂) at 10 MV/cm field strength, with electron tunneling initiating at 6.5 V across 6.5 nm oxide thickness**.

### 2.2 FMEA (Failure Mode & Effects Analysis)
| Event Trigger | Severity | Failure Mode | Mitigation Strategy |
| :--- | :--- | :--- | :--- |
| Clock signal metastability with setup time violation below 150 ps at 100 MHz operation | 8 | Unpredictable output state oscillation between 0 and 1 for 2-3 clock cycles | Dual-rank synchronizer with 2-stage flip-flop chain and 300 ps minimum setup time margin |
| Electrostatic discharge (ESD) event exceeding 2 kV HBM (Human Body Model) | 8 | Gate oxide puncture creating permanent short circuit between input and substrate | Integrated ESD protection diodes clamping at 5.5 V with 1.5 Ω series resistance |

## 3. Key Technical Parameters
| Parameter | Value | Unit | Status |
| :--- | :--- | :--- | :--- |
| spec | Config-dependent | ns | Verified |

## 4. System BOM & Knowledge Routing
### Core Components (Recursive Links)

### Industrial DNA Context (De-duplicated)
**Complementary Dependencies**: **Wafer Prober**, **Die Attach Machine**, **Wire Bonder**  
**Downstream Applications**: Microprocessors, Memory Chips, Digital Signal Processors  

## 5. Engineering Risks & FAQ
- **Caution**: 
- **Caution**: 
- **Caution**: 

### Q: What is the primary function of a latch/flip-flop in digital circuits?
**A**: A latch/flip-flop serves as a basic memory element that stores one binary bit (0 or 1), maintaining its output state until changed by specific input signals, enabling sequential logic operations.

### Q: What materials are used in manufacturing semiconductor latches/flip-flops?
**A**: These components are primarily fabricated using semiconductor-grade silicon as the base material, with transistor gates, metal interconnects, and substrate layers forming the complete structure.

### Q: How do latches differ from flip-flops in digital electronics?
**A**: Latches are level-sensitive and transparent when enabled, while flip-flops are edge-triggered and change state only at clock transitions, making flip-flops more suitable for synchronous systems.

## 6. Manufacturing Compliance
- ISO 9001:2015 - QUALITY MANAGEMENT SYSTEMS

---
### 🛠️ Engineering Resource Access
🔗 **[Full Specification: Latch/Flip-Flop](https://cnfx.com/industry/computer-electronic-and-optical-product-manufacturing/product/latchflip-flop)**

### 🌐 Knowledge Graph Topology
> **Node Status**: Verified Engineering Spec
> **Connectivity**: Linked to **3** standalone system nodes
> **Global Context**: Part of a 5,814 node industrial cluster within the CNFX Graph

> **Reference ID**: LATCHFLIP_FLOP | **Authority**: CNFX-2026-ST-001 | **Fingerprint**: 0733a2cf
