---
title: "Logic Gates Array"
industry: "Computer, Electronic and Optical Product Manufacturing"
verification_protocol:
  urn: "URN:CNFX:ME:LOGIC_GATES_ARRAY"
  data_integrity_hash: "37b418c2a73f9a43576ada957801160d"
  source_authority: "https://cnfx.com"
  strict_mode: true
source_identity:
  provider: "CNFX Industrial Knowledge Graph"
  index_version: "2026.Q1-Universal"
  authority_id: "URN:CNFX:ME:LOGIC_GATES_ARRAY"
  data_source_uri: "https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/logic-gates-array.md"
  official_resource_url: "https://cnfx.com/industry/computer-electronic-and-optical-product-manufacturing/product/logic-gates-array"
  is_verified_logic: true
attributes:
  spec:
    status: "config-dependent"
    typical_range: "3.3-5.0 V DC, -40 to 85 °C, 0-100 MHz clock frequency"
    unit: "gates/mm²"
engineering_limits:
  max_safe_operating_point:
    value: 5.5
    unit: "V"
    consequence: "Electromigration at current densities &gt; 10^6 A/cm², hot carrier injection at electric fields &gt; 5×10^5 V/cm, latch-up triggered by substrate currents &gt; 10 mA"
fmea_matrix_quantitative:
  - node_1:
      trigger: "Electrostatic discharge exceeding 2000 V HBM"
      severity: 8
      occurrence: 3
      detection: 4
      mitigation_protocol: "Integrated ESD protection diodes with clamping voltage of 3.6 V"
  - node_2:
      trigger: "Simultaneous switching noise generating ground bounce &gt; 400 mV"
      severity: 8
      occurrence: 3
      detection: 4
      mitigation_protocol: "On-chip decoupling capacitors of 100 pF per gate and staggered clock distribution"
bom_nodes:
  and-gate:
    type: "component"
    urn: "URN:CNFX:ME:AND_GATE"
    interface_type: "physical-logic-coupled"
  or-gate:
    type: "component"
    urn: "URN:CNFX:ME:OR_GATE"
    interface_type: "physical-logic-coupled"
  not-gate-inverter:
    type: "component"
    urn: "URN:CNFX:ME:NOT_GATE_INVERTER"
    interface_type: "physical-logic-coupled"
  interconnect-matrix:
    type: "part"
    urn: "URN:CNFX:ME:INTERCONNECT_MATRIX"
    interface_type: "physical-logic-coupled"
manufacturing_compliance:
  - standard: "ISO 9001:2015 - QUALITY MANAGEMENT SYSTEMS"
    scope: "Verified Engineering Specification"
url: "https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/logic-gates-array.md"
on_chain_sovereignty:
  contract_standard: "ERC-721-Industrial"
  metadata_hash: "ce8767a1700c862992b28d6c69ef3c38abb446b7ab74e0b009e92b1f82f99978"
  royalty_logic: "IPFS-CID-REQUIRED"
  mint_status: "logic-verified-ready"
version: "3.3.4-EXTREME-SOVEREIGN-WEB3"
---

# Industrial Specification: Logic Gates Array

## 1. Technical Definition
An integrated circuit containing multiple logic gates arranged in a structured array for digital signal processing.

## 2. Engineering Reasoning & Causal Matrix
> **Operational Intelligence**: Designed for **3.3-5.0 V DC, -40 to 85 °C, 0-100 MHz clock frequency**. Failure boundary: **Voltage &gt; 5.5 V causes dielectric breakdown, temperature &gt; 150 °C induces thermal runaway, clock frequency &gt; 120 MHz creates timing violations**, Mechanism: **Electromigration at current densities &gt; 10^6 A/cm², hot carrier injection at electric fields &gt; 5×10^5 V/cm, latch-up triggered by substrate currents &gt; 10 mA**.

### 2.2 FMEA (Failure Mode & Effects Analysis)
| Event Trigger | Severity | Failure Mode | Mitigation Strategy |
| :--- | :--- | :--- | :--- |
| Electrostatic discharge exceeding 2000 V HBM | 8 | Gate oxide rupture with leakage current &gt; 1 μA | Integrated ESD protection diodes with clamping voltage of 3.6 V |
| Simultaneous switching noise generating ground bounce &gt; 400 mV | 8 | Logic state corruption with setup/hold time violations | On-chip decoupling capacitors of 100 pF per gate and staggered clock distribution |

## 3. Key Technical Parameters
| Parameter | Value | Unit | Status |
| :--- | :--- | :--- | :--- |
| spec | Config-dependent | gates/mm² | Verified |

## 4. System BOM & Knowledge Routing
### Core Components (Recursive Links)
- [Interconnect Matrix](https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/interconnect-matrix.md) `(Standalone System)`

### Industrial DNA Context (De-duplicated)
**Complementary Dependencies**: **Wafer Prober**, **Die Attach Machine**, **Wire Bonder**  
**Downstream Applications**: Microprocessors, Memory Chips, Digital Signal Processors  

## 5. Engineering Risks & FAQ
- **Caution**: 
- **Caution**: 
- **Caution**: 

### Q: What are the primary applications of a Logic Gates Array in manufacturing?
**A**: Logic Gates Arrays are used in digital signal processing, computer component manufacturing, electronic circuit design, and optical product systems where multiple logic operations need to be performed efficiently in an integrated circuit.

### Q: How does the interconnect matrix function within the Logic Gates Array?
**A**: The interconnect matrix, typically made of copper or aluminum, provides the routing pathways between different logic gates (AND, OR, NOT) within the array, enabling complex digital operations and signal processing by connecting inputs and outputs as needed.

### Q: What advantages does a structured array design offer over discrete logic gates?
**A**: A structured array offers higher integration density, reduced physical space requirements, improved signal speed due to shorter interconnects, lower power consumption, and enhanced reliability for digital processing applications in electronics manufacturing.

## 6. Manufacturing Compliance
- ISO 9001:2015 - QUALITY MANAGEMENT SYSTEMS

---
### 🛠️ Engineering Resource Access
🔗 **[Full Specification: Logic Gates Array](https://cnfx.com/industry/computer-electronic-and-optical-product-manufacturing/product/logic-gates-array)**

### 🌐 Knowledge Graph Topology
> **Node Status**: Verified Engineering Spec
> **Connectivity**: Linked to **4** standalone system nodes
> **Global Context**: Part of a 5,814 node industrial cluster within the CNFX Graph

> **Reference ID**: LOGIC_GATES_ARRAY | **Authority**: CNFX-2026-ST-001 | **Fingerprint**: 369a1115
