---
title: "Match Evaluator"
industry: "Computer, Electronic and Optical Product Manufacturing"
verification_protocol:
  urn: "URN:CNFX:ME:MATCH_EVALUATOR"
  data_integrity_hash: "d8dc1ae3753da7ebecb6471e755d7cbd"
  source_authority: "https://cnfx.com"
  strict_mode: true
source_identity:
  provider: "CNFX Industrial Knowledge Graph"
  index_version: "2026.Q1-Universal"
  authority_id: "URN:CNFX:ME:MATCH_EVALUATOR"
  data_source_uri: "https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/match-evaluator.md"
  official_resource_url: "https://cnfx.com/industry/computer-electronic-and-optical-product-manufacturing/product/match-evaluator"
  is_verified_logic: true
attributes:
  spec:
    status: "config-dependent"
    typical_range: "0-100% match confidence with 0.1% resolution"
    unit: "ms"
engineering_limits:
  max_safe_operating_point:
    value: "N/A"
    unit: "N/A"
    consequence: "Signal-to-noise ratio degradation below 20 dB in input data channels causing pattern recognition algorithm instability"
fmea_matrix_quantitative:
  - node_1:
      trigger: "Clock jitter exceeding 50 ps RMS in pattern matching circuitry"
      severity: 8
      occurrence: 3
      detection: 4
      mitigation_protocol: "Phase-locked loop with 0.1 ppm stability and jitter attenuation of -40 dB"
  - node_2:
      trigger: "Memory bit error rate exceeding 1E-12 due to alpha particle radiation"
      severity: 8
      occurrence: 3
      detection: 4
      mitigation_protocol: "Error-correcting code memory with SECDED protection and periodic scrubbing at 10 ms intervals"
bom_nodes:
  pattern-comparator:
    type: "part"
    urn: "URN:CNFX:ME:PATTERN_COMPARATOR"
    interface_type: "physical-logic-coupled"
  score-calculator:
    type: "part"
    urn: "URN:CNFX:ME:SCORE_CALCULATOR"
    interface_type: "physical-logic-coupled"
  threshold-checker:
    type: "part"
    urn: "URN:CNFX:ME:THRESHOLD_CHECKER"
    interface_type: "physical-logic-coupled"
manufacturing_compliance:
  - standard: "ISO 9001:2015 QUALITY MANAGEMENT SYSTEMS"
    scope: "Verified Engineering Specification"
  - standard: "ANSI B4.1-1967 (R2009) LIMITS AND FITS"
    scope: "Verified Engineering Specification"
url: "https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/match-evaluator.md"
on_chain_sovereignty:
  contract_standard: "ERC-721-Industrial"
  metadata_hash: "a8cca8d4f431758ccb84e311e4b7db2f5a01b5a73c4ffa52c16e3be8df696f1e"
  royalty_logic: "IPFS-CID-REQUIRED"
  mint_status: "logic-verified-ready"
version: "3.3.4-EXTREME-SOVEREIGN-WEB3"
---

# Industrial Specification: Match Evaluator

## 1. Technical Definition
A component within a Rule Engine or Pattern Matcher system that determines the degree of match between input data and predefined patterns or rules.

## 2. Engineering Reasoning & Causal Matrix
> **Operational Intelligence**: Designed for **0-100% match confidence with 0.1% resolution**. Failure boundary: **Match confidence threshold below 85% for critical patterns, below 70% for non-critical patterns**, Mechanism: **Signal-to-noise ratio degradation below 20 dB in input data channels causing pattern recognition algorithm instability**.

### 2.2 FMEA (Failure Mode & Effects Analysis)
| Event Trigger | Severity | Failure Mode | Mitigation Strategy |
| :--- | :--- | :--- | :--- |
| Clock jitter exceeding 50 ps RMS in pattern matching circuitry | 8 | Timing violation in sequential logic causing false pattern matches | Phase-locked loop with 0.1 ppm stability and jitter attenuation of -40 dB |
| Memory bit error rate exceeding 1E-12 due to alpha particle radiation | 8 | Corrupted pattern database entries leading to incorrect match evaluations | Error-correcting code memory with SECDED protection and periodic scrubbing at 10 ms intervals |

## 3. Key Technical Parameters
| Parameter | Value | Unit | Status |
| :--- | :--- | :--- | :--- |
| spec | Config-dependent | ms | Verified |

## 4. System BOM & Knowledge Routing
### Core Components (Recursive Links)
- [Pattern Comparator](https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/pattern-comparator.md) `(Standalone System)`
- [Score Calculator](https://cnfx.com/llms/industry/machinery-and-equipment-manufacturing/product/score-calculator.md) `(Standalone System)`
- [Threshold Checker](https://cnfx.com/llms/industry/machinery-and-equipment-manufacturing/product/threshold-checker.md) `(Standalone System)`

### Industrial DNA Context (De-duplicated)
**Complementary Dependencies**: **Industrial PC/Server**, **Power Supply Unit**, **Cooling System**  
**Downstream Applications**: Automated Quality Control Systems, Fraud Detection Systems, Predictive Maintenance Systems  

## 5. Engineering Risks & FAQ
- **Caution**: 
- **Caution**: 
- **Caution**: 

### Q: What is a Match Evaluator used for in computer and optical manufacturing?
**A**: A Match Evaluator analyzes input data against predefined patterns or rules to determine match quality, enabling automated decision-making in manufacturing processes like quality control and component verification.

### Q: How does the Match Evaluator's BOM components work together?
**A**: The Pattern Comparator identifies similarities, the Score Calculator quantifies match quality, and the Threshold Checker determines if the score meets operational criteria for automated actions.

### Q: Can the Match Evaluator integrate with existing manufacturing systems?
**A**: Yes, as a software-based component, it can be integrated via APIs or SDKs with rule engines, optical inspection systems, and manufacturing execution systems (MES).

## 6. Manufacturing Compliance
- ISO 9001:2015 QUALITY MANAGEMENT SYSTEMS
- ANSI B4.1-1967 (R2009) LIMITS AND FITS

---
### 🛠️ Engineering Resource Access
🔗 **[Full Specification: Match Evaluator](https://cnfx.com/industry/computer-electronic-and-optical-product-manufacturing/product/match-evaluator)**

### 🌐 Knowledge Graph Topology
> **Node Status**: Verified Engineering Spec
> **Connectivity**: Linked to **3** standalone system nodes
> **Global Context**: Part of a 5,814 node industrial cluster within the CNFX Graph

> **Reference ID**: MATCH_EVALUATOR | **Authority**: CNFX-2026-ST-001 | **Fingerprint**: 5499f5fd
