---
title: "Multiplexer"
industry: "Computer, Electronic and Optical Product Manufacturing"
verification_protocol:
  urn: "URN:CNFX:ME:MULTIPLEXER"
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  source_authority: "https://cnfx.com"
  strict_mode: true
source_identity:
  provider: "CNFX Industrial Knowledge Graph"
  index_version: "2026.Q1-Universal"
  authority_id: "URN:CNFX:ME:MULTIPLEXER"
  data_source_uri: "https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/multiplexer.md"
  official_resource_url: "https://cnfx.com/industry/computer-electronic-and-optical-product-manufacturing/product/multiplexer"
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attributes:
  spec:
    status: "config-dependent"
    typical_range: "0-5 VDC input voltage, -40 to 85°C ambient temperature, 0-100% relative humidity (non-condensing)"
    unit: "channels"
engineering_limits:
  max_safe_operating_point:
    value: 5.5
    unit: "VDC"
    consequence: "Electromigration in aluminum interconnects at current densities exceeding 1×10⁶ A/cm², dielectric breakdown at electric field strengths exceeding 10 MV/m in SiO₂ insulation, latch-up triggered by substrate currents exceeding 100 mA"
fmea_matrix_quantitative:
  - node_1:
      trigger: "Electrostatic discharge (ESD) event exceeding 2 kV human body model"
      severity: 8
      occurrence: 3
      detection: 4
      mitigation_protocol: "Integrated ESD protection diodes with 5 ns response time and 1.5 A clamping current"
  - node_2:
      trigger: "Clock signal jitter exceeding 200 ps RMS at 100 MHz operating frequency"
      severity: 8
      occurrence: 3
      detection: 4
      mitigation_protocol: "Phase-locked loop (PLL) synchronization with 50 ps jitter tolerance and 10 ppm frequency stability"
bom_nodes:
  input-buffer:
    type: "component"
    urn: "URN:CNFX:ME:INPUT_BUFFER"
    interface_type: "physical-logic-coupled"
  selector-switch:
    type: "part"
    urn: "URN:CNFX:ME:SELECTOR_SWITCH"
    interface_type: "physical-logic-coupled"
  control-logic:
    type: "part"
    urn: "URN:CNFX:ME:CONTROL_LOGIC"
    interface_type: "physical-logic-coupled"
  output-driver:
    type: "part"
    urn: "URN:CNFX:ME:OUTPUT_DRIVER"
    interface_type: "physical-logic-coupled"
manufacturing_compliance:
  - standard: "ISO 9001:2015 - QUALITY MANAGEMENT SYSTEMS"
    scope: "Verified Engineering Specification"
  - standard: "IEC 61000-6-2:2016 - ELECTROMAGNETIC COMPATIBILITY (EMC)"
    scope: "Verified Engineering Specification"
url: "https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/multiplexer.md"
on_chain_sovereignty:
  contract_standard: "ERC-721-Industrial"
  metadata_hash: "a530ca6e6ab13f8d8bd932e1129efa0acce01a56e4734b282e87c96e193dd9fb"
  royalty_logic: "IPFS-CID-REQUIRED"
  mint_status: "logic-verified-ready"
version: "3.3.4-EXTREME-SOVEREIGN-WEB3"
---

# Industrial Specification: Multiplexer

## 1. Technical Definition
A device that selects one of several input signals and forwards it to a single output line

## 2. Engineering Reasoning & Causal Matrix
> **Operational Intelligence**: Designed for **0-5 VDC input voltage, -40 to 85°C ambient temperature, 0-100% relative humidity (non-condensing)**. Failure boundary: **Input voltage exceeding 5.5 VDC causes semiconductor junction breakdown, ambient temperature exceeding 125°C initiates thermal runaway in CMOS transistors, relative humidity exceeding 85% initiates electrochemical migration**, Mechanism: **Electromigration in aluminum interconnects at current densities exceeding 1×10⁶ A/cm², dielectric breakdown at electric field strengths exceeding 10 MV/m in SiO₂ insulation, latch-up triggered by substrate currents exceeding 100 mA**.

### 2.2 FMEA (Failure Mode & Effects Analysis)
| Event Trigger | Severity | Failure Mode | Mitigation Strategy |
| :--- | :--- | :--- | :--- |
| Electrostatic discharge (ESD) event exceeding 2 kV human body model | 8 | Gate oxide rupture in CMOS switching transistors | Integrated ESD protection diodes with 5 ns response time and 1.5 A clamping current |
| Clock signal jitter exceeding 200 ps RMS at 100 MHz operating frequency | 8 | Setup/hold time violations causing metastability in flip-flop circuits | Phase-locked loop (PLL) synchronization with 50 ps jitter tolerance and 10 ppm frequency stability |

## 3. Key Technical Parameters
| Parameter | Value | Unit | Status |
| :--- | :--- | :--- | :--- |
| spec | Config-dependent | channels | Verified |

## 4. System BOM & Knowledge Routing
### Core Components (Recursive Links)
- [Selector Switch](https://cnfx.com/llms/industry/electrical-equipment-manufacturing/product/selector-switch.md) `(Standalone System)`
- [Control Logic](https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/control-logic.md) `(Standalone System)`
- [Output Driver](https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/output-driver.md) `(Standalone System)`

### Industrial DNA Context (De-duplicated)
**Complementary Dependencies**: **Signal Generator**, **Oscilloscope**, **Power Supply Unit**  
**Downstream Applications**: Telecommunication Switches, Data Acquisition Systems, Broadcast Equipment  

## 5. Engineering Risks & FAQ
- **Caution**: 
- **Caution**: 
- **Caution**: 

### Q: What are the main applications of this multiplexer in computer and optical product manufacturing?
**A**: This multiplexer is used for signal routing in data acquisition systems, telecommunications equipment, optical network switches, and computer peripheral interfaces where multiple input sources need to be managed efficiently.

### Q: How does the silicon and copper construction affect the multiplexer's performance?
**A**: Silicon provides reliable semiconductor properties for the control logic and selector switch, while copper ensures excellent conductivity in the input/output pathways, resulting in minimal signal loss and high-speed operation.

### Q: What maintenance considerations are important for industrial multiplexers?
**A**: Regular inspection of input buffers and output drivers for signal integrity, monitoring thermal performance due to silicon components, and ensuring clean connections in copper pathways are essential for optimal long-term operation.

## 6. Manufacturing Compliance
- ISO 9001:2015 - QUALITY MANAGEMENT SYSTEMS
- IEC 61000-6-2:2016 - ELECTROMAGNETIC COMPATIBILITY (EMC)

---
### 🛠️ Engineering Resource Access
🔗 **[Full Specification: Multiplexer](https://cnfx.com/industry/computer-electronic-and-optical-product-manufacturing/product/multiplexer)**

### 🌐 Knowledge Graph Topology
> **Node Status**: Verified Engineering Spec
> **Connectivity**: Linked to **4** standalone system nodes
> **Global Context**: Part of a 5,814 node industrial cluster within the CNFX Graph

> **Reference ID**: MULTIPLEXER | **Authority**: CNFX-2026-ST-001 | **Fingerprint**: d6eec38e
