---
title: "Optical Source/IR Emitter"
industry: "Computer, Electronic and Optical Product Manufacturing"
verification_protocol:
  urn: "URN:CNFX:ME:OPTICAL_SOURCEIR_EMITTER"
  data_integrity_hash: "2b70a52959db804707647ab948fce344"
  source_authority: "https://cnfx.com"
  strict_mode: true
source_identity:
  provider: "CNFX Industrial Knowledge Graph"
  index_version: "2026.Q1-Universal"
  authority_id: "URN:CNFX:ME:OPTICAL_SOURCEIR_EMITTER"
  data_source_uri: "https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/optical-sourceir-emitter.md"
  official_resource_url: "https://cnfx.com/industry/computer-electronic-and-optical-product-manufacturing/product/optical-sourceir-emitter"
  is_verified_logic: true
attributes:
  spec:
    status: "config-dependent"
    typical_range: "850-1550 nm wavelength, 5-100 mW optical power output, -40°C to +85°C ambient temperature"
    unit: "nm"
engineering_limits:
  max_safe_operating_point:
    value: 5
    unit: "nm"
    consequence: "Quantum efficiency degradation due to Auger recombination at high current densities, dark line defect propagation in semiconductor lattice, facet coating delamination from thermal cycling stress"
fmea_matrix_quantitative:
  - node_1:
      trigger: "Current density exceeding 10 kA/cm² during transient electrical overshoot"
      severity: 8
      occurrence: 3
      detection: 4
      mitigation_protocol: "Integrate current-limiting circuitry with 5 ms response time and implement thermoelectric cooler with PID control"
  - node_2:
      trigger: "Moisture ingress exceeding 5000 ppm through compromised hermetic seal"
      severity: 8
      occurrence: 3
      detection: 4
      mitigation_protocol: "Apply gold-tin eutectic solder sealing at 280°C with helium leak rate &lt;1×10⁻⁸ atm·cc/s"
bom_nodes:
  semiconductor-chip:
    type: "component"
    urn: "URN:CNFX:ME:SEMICONDUCTOR_CHIP"
    interface_type: "physical-logic-coupled"
  packagelens:
    type: "component"
    urn: "URN:CNFX:ME:PACKAGELENS"
    interface_type: "physical-logic-coupled"
  lead-frame:
    type: "component"
    urn: "URN:CNFX:ME:LEAD_FRAME"
    interface_type: "physical-logic-coupled"
manufacturing_compliance:
  - standard: "ISO 11146-1:2021 - LASER BEAM PARAMETERS"
    scope: "Verified Engineering Specification"
url: "https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/optical-sourceir-emitter.md"
on_chain_sovereignty:
  contract_standard: "ERC-721-Industrial"
  metadata_hash: "5eea0a393013fece3576135e995b7c578a0e7c57b914c9988f53cd2061cbeee2"
  royalty_logic: "IPFS-CID-REQUIRED"
  mint_status: "logic-verified-ready"
version: "3.3.4-EXTREME-SOVEREIGN-WEB3"
---

# Industrial Specification: Optical Source/IR Emitter

## 1. Technical Definition
A component that generates infrared light for concentration measurement in sensors.

## 2. Engineering Reasoning & Causal Matrix
> **Operational Intelligence**: Designed for **850-1550 nm wavelength, 5-100 mW optical power output, -40°C to +85°C ambient temperature**. Failure boundary: **Wavelength drift &gt; ±5 nm from nominal, optical power degradation &gt; 30% from initial output, junction temperature exceeding 125°C**, Mechanism: **Quantum efficiency degradation due to Auger recombination at high current densities, dark line defect propagation in semiconductor lattice, facet coating delamination from thermal cycling stress**.

### 2.1 Analytical Physics Model
Governed by the **Rayleigh Resolution Criterion**:

> **Primary Equation**: $d = \frac{0.61 \lambda}{NA}$  
> **Engineering Impact**: Defines the theoretical limit of machine vision systems.

| Symbol | Variable Definition | Localized Reference |
| :--- | :--- | :--- |
| \lambda | Wavelength | Engineering Constant |
| NA | Numerical Aperture | Engineering Constant |

### 2.2 FMEA (Failure Mode & Effects Analysis)
| Event Trigger | Severity | Failure Mode | Mitigation Strategy |
| :--- | :--- | :--- | :--- |
| Current density exceeding 10 kA/cm² during transient electrical overshoot | 8 | Catastrophic optical damage at laser diode facet | Integrate current-limiting circuitry with 5 ms response time and implement thermoelectric cooler with PID control |
| Moisture ingress exceeding 5000 ppm through compromised hermetic seal | 8 | Corrosion-induced increase in threshold current by &gt;50% | Apply gold-tin eutectic solder sealing at 280°C with helium leak rate &lt;1×10⁻⁸ atm·cc/s |

## 3. Key Technical Parameters
| Parameter | Value | Unit | Status |
| :--- | :--- | :--- | :--- |
| spec | Config-dependent | nm | Verified |

## 4. System BOM & Knowledge Routing
### Core Components (Recursive Links)

### Industrial DNA Context (De-duplicated)
**Complementary Dependencies**: **Precision Power Supply**, **Thermal Management System**, **Optical Alignment Station**  
**Downstream Applications**: Infrared Gas Sensors, Spectrophotometers, Biometric Security Devices  

## 5. Engineering Risks & FAQ
- **Caution**: 
- **Caution**: 
- **Caution**: 

### Q: What are the key applications of this IR emitter in optical product manufacturing?
**A**: This optical source is primarily used in concentration measurement sensors for industrial monitoring, environmental analysis, and process control systems within computer and optical manufacturing sectors.

### Q: How does the Gallium Arsenide material affect the IR emitter's performance?
**A**: Gallium Arsenide (GaAs) provides excellent infrared emission efficiency and thermal stability, making it ideal for precise concentration measurement applications requiring consistent light output.

### Q: What are the advantages of using InGaAs in this optical source component?
**A**: Indium Gallium Arsenide (InGaAs) extends the wavelength range and improves quantum efficiency, enabling more accurate concentration measurements across broader spectral ranges in sensor applications.

## 6. Manufacturing Compliance
- ISO 11146-1:2021 - LASER BEAM PARAMETERS

---
### 🛠️ Engineering Resource Access
🔗 **[Full Specification: Optical Source/IR Emitter](https://cnfx.com/industry/computer-electronic-and-optical-product-manufacturing/product/optical-sourceir-emitter)**

### 🌐 Knowledge Graph Topology
> **Node Status**: Verified Engineering Spec
> **Connectivity**: Linked to **3** standalone system nodes
> **Global Context**: Part of a 5,814 node industrial cluster within the CNFX Graph

> **Reference ID**: OPTICAL_SOURCEIR_EMITTER | **Authority**: CNFX-2026-ST-001 | **Fingerprint**: 8ca4a83b
