---
title: "Optical Spectrometer"
industry: "Computer, Electronic and Optical Product Manufacturing"
verification_protocol:
  urn: "URN:CNFX:ME:OPTICAL_SPECTROMETER"
  data_integrity_hash: "069ae4d8d668845f66113ecadfe1f3ee"
  source_authority: "https://cnfx.com"
  strict_mode: true
source_identity:
  provider: "CNFX Industrial Knowledge Graph"
  index_version: "2026.Q1-Universal"
  authority_id: "URN:CNFX:ME:OPTICAL_SPECTROMETER"
  data_source_uri: "https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/optical-spectrometer.md"
  official_resource_url: "https://cnfx.com/industry/computer-electronic-and-optical-product-manufacturing/product/optical-spectrometer"
  is_verified_logic: true
attributes:
  primary_spec:
    status: "config-dependent"
    typical_range: "190-1100 nm wavelength, 0.1-2.0 nm spectral resolution, 15-35°C ambient temperature"
    unit: "nm"
engineering_limits:
  max_safe_operating_point:
    value: 1200
    unit: "nm"
    consequence: "Silicon detector bandgap (1.12 eV) limits photon absorption beyond 1100 nm, grating blaze angle (typically 26.5°) optimization for specific wavelength ranges, CCD thermal noise doubling every 6-8°C (Arrhenius equation)"
fmea_matrix_quantitative:
  - node_1:
      trigger: "Ambient temperature exceeding 35°C for &gt;30 minutes"
      severity: 8
      occurrence: 3
      detection: 4
      mitigation_protocol: "Integrated Peltier cooling maintaining detector at -15°C ±0.5°C with PID control"
  - node_2:
      trigger: "Mechanical vibration at 50-200 Hz frequency with &gt;0.5 g acceleration"
      severity: 8
      occurrence: 3
      detection: 4
      mitigation_protocol: "Kinematic mounting with 6-axis vibration isolation providing 40 dB attenuation at 100 Hz"
bom_nodes:
  optical_entrance_slit:
    type: "component"
    urn: "URN:CNFX:ME:OPTICAL_ENTRANCE_SLIT"
    interface_type: "physical-logic-coupled"
  collimating_mirror:
    type: "component"
    urn: "URN:CNFX:ME:COLLIMATING_MIRROR"
    interface_type: "physical-logic-coupled"
  diffraction_grating:
    type: "part"
    urn: "URN:CNFX:ME:DIFFRACTION_GRATING"
    interface_type: "physical-logic-coupled"
  focusing_mirror:
    type: "component"
    urn: "URN:CNFX:ME:FOCUSING_MIRROR"
    interface_type: "physical-logic-coupled"
  ccd_detector_array:
    type: "part"
    urn: "URN:CNFX:ME:CCD_DETECTOR_ARRAY"
    interface_type: "physical-logic-coupled"
  thermal_regulation_system:
    type: "part"
    urn: "URN:CNFX:ME:THERMAL_REGULATION_SYSTEM"
    interface_type: "physical-logic-coupled"
manufacturing_compliance:
  - standard: "ISO 9001:2015 - QUALITY MANAGEMENT SYSTEMS"
    scope: "Verified Engineering Specification"
url: "https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/optical-spectrometer.md"
on_chain_sovereignty:
  contract_standard: "ERC-721-Industrial"
  metadata_hash: "185515eefda8541df407365d804d37f3441e258f0726812e4c3accdb5776e7e5"
  royalty_logic: "IPFS-CID-REQUIRED"
  mint_status: "logic-verified-ready"
version: "3.3.4-EXTREME-SOVEREIGN-WEB3"
---

# Industrial Specification: Optical Spectrometer

## 1. Technical Definition
An analytical instrument that measures the intensity of light as a function of wavelength to determine the elemental composition of materials.

## 2. Engineering Reasoning & Causal Matrix
> **Operational Intelligence**: Designed for **190-1100 nm wavelength, 0.1-2.0 nm spectral resolution, 15-35°C ambient temperature**. Failure boundary: **Detector quantum efficiency drops below 10% at 1200 nm, grating efficiency falls below 30% at 5° incidence angle deviation, CCD dark current exceeds 1000 e-/pixel/sec at 40°C**, Mechanism: **Silicon detector bandgap (1.12 eV) limits photon absorption beyond 1100 nm, grating blaze angle (typically 26.5°) optimization for specific wavelength ranges, CCD thermal noise doubling every 6-8°C (Arrhenius equation)**.

### 2.1 Analytical Physics Model
Governed by the **Rayleigh Resolution Criterion**:

> **Primary Equation**: $d = \frac{0.61 \lambda}{NA}$  
> **Engineering Impact**: Defines the theoretical limit of machine vision systems.

| Symbol | Variable Definition | Localized Reference |
| :--- | :--- | :--- |
| \lambda | Wavelength | Engineering Constant |
| NA | Numerical Aperture | Engineering Constant |

### 2.2 FMEA (Failure Mode & Effects Analysis)
| Event Trigger | Severity | Failure Mode | Mitigation Strategy |
| :--- | :--- | :--- | :--- |
| Ambient temperature exceeding 35°C for &gt;30 minutes | 8 | CCD dark current noise increases by 500%, signal-to-noise ratio drops below 3:1 | Integrated Peltier cooling maintaining detector at -15°C ±0.5°C with PID control |
| Mechanical vibration at 50-200 Hz frequency with &gt;0.5 g acceleration | 8 | Grating alignment shifts &gt;0.01°, spectral calibration drift exceeds 0.5 nm | Kinematic mounting with 6-axis vibration isolation providing 40 dB attenuation at 100 Hz |

## 3. Key Technical Parameters
| Parameter | Value | Unit | Status |
| :--- | :--- | :--- | :--- |
| primary_spec | Config-dependent | nm | Verified |

## 4. System BOM & Knowledge Routing
### Core Components (Recursive Links)
- [Diffraction Grating](https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/diffraction-grating.md) `(Standalone System)`
- [CCD Detector Array](https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/ccd-detector-array.md) `(Standalone System)`
- [Thermal Regulation System](https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/thermal-regulation-system.md) `(Standalone System)`

### Industrial DNA Context (De-duplicated)
**Complementary Dependencies**: **Sample Preparation System**, **Calibration Light Source**, **Data Acquisition Computer**  
**Downstream Applications**: Semiconductor Wafers, Pharmaceutical Tablets, Metal Alloy Components  

## 5. Engineering Risks & FAQ
- **Caution**: 
- **Caution**: 
- **Caution**: 

### Q: What is the typical analysis time for this optical spectrometer?
**A**: This optical spectrometer provides rapid analysis with measurement times typically completed within seconds, enabling efficient quality control and material testing workflows.

### Q: What materials can this spectrometer analyze in electronic manufacturing?
**A**: The spectrometer is designed for analyzing various materials used in computer, electronic and optical product manufacturing, including semiconductors, optical components, coatings, and alloys, with detection limits reaching ppm levels.

### Q: How does the thermal regulation system improve spectrometer performance?
**A**: The integrated thermal regulation system maintains stable operating temperatures for the CCD detector array and optical components, ensuring consistent spectral measurements, reduced thermal noise, and enhanced long-term accuracy in industrial environments.

## 6. Manufacturing Compliance
- ISO 9001:2015 - QUALITY MANAGEMENT SYSTEMS

---
### 🛠️ Engineering Resource Access
🔗 **[Full Specification: Optical Spectrometer](https://cnfx.com/industry/computer-electronic-and-optical-product-manufacturing/product/optical-spectrometer)**

### 🌐 Knowledge Graph Topology
> **Node Status**: Verified Engineering Spec
> **Connectivity**: Linked to **6** standalone system nodes
> **Global Context**: Part of a 5,814 node industrial cluster within the CNFX Graph

> **Reference ID**: OPTICAL_SPECTROMETER | **Authority**: CNFX-2026-ST-001 | **Fingerprint**: 7df79918
