---
title: "Programmable Interconnect"
industry: "Computer, Electronic and Optical Product Manufacturing"
verification_protocol:
  urn: "URN:CNFX:ME:PROGRAMMABLE_INTERCONNECT"
  data_integrity_hash: "91ed11072165bd4beccfe622fa22f28c"
  source_authority: "https://cnfx.com"
  strict_mode: true
source_identity:
  provider: "CNFX Industrial Knowledge Graph"
  index_version: "2026.Q1-Universal"
  authority_id: "URN:CNFX:ME:PROGRAMMABLE_INTERCONNECT"
  data_source_uri: "https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/programmable-interconnect.md"
  official_resource_url: "https://cnfx.com/industry/computer-electronic-and-optical-product-manufacturing/product/programmable-interconnect"
  is_verified_logic: true
attributes:
  spec:
    status: "config-dependent"
    typical_range: "1.2-3.3 V, 0-100 MHz signal frequency, -40 to 125°C ambient temperature"
    unit: "mm"
engineering_limits:
  max_safe_operating_point:
    value: 1.1
    unit: "V"
    consequence: "Electromigration at current densities exceeding 1×10⁶ A/cm², dielectric breakdown at electric fields &gt;10 MV/cm, latch-up triggered by transient currents &gt;100 mA"
fmea_matrix_quantitative:
  - node_1:
      trigger: "Electrostatic discharge (ESD) event exceeding 2 kV HBM"
      severity: 8
      occurrence: 3
      detection: 4
      mitigation_protocol: "Integrated ESD protection diodes with 5 Ω series resistance at all I/O pins"
  - node_2:
      trigger: "Clock skew exceeding 500 ps between routing segments"
      severity: 8
      occurrence: 3
      detection: 4
      mitigation_protocol: "Balanced clock tree with maximum 100 ps skew tolerance per routing zone"
bom_nodes:
  programmable-switch-matrix:
    type: "part"
    urn: "URN:CNFX:ME:PROGRAMMABLE_SWITCH_MATRIX"
    interface_type: "physical-logic-coupled"
  routing-channels:
    type: "component"
    urn: "URN:CNFX:ME:ROUTING_CHANNELS"
    interface_type: "physical-logic-coupled"
  configuration-memory-cells:
    type: "component"
    urn: "URN:CNFX:ME:CONFIGURATION_MEMORY_CELLS"
    interface_type: "physical-logic-coupled"
manufacturing_compliance:
  - standard: "ISO 9001:2015 QUALITY MANAGEMENT SYSTEMS"
    scope: "Verified Engineering Specification"
  - standard: "CE MARKING (EU DIRECTIVE 2014/35/EU FOR LOW VOLTAGE EQUIPMENT)"
    scope: "Verified Engineering Specification"
url: "https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/programmable-interconnect.md"
on_chain_sovereignty:
  contract_standard: "ERC-721-Industrial"
  metadata_hash: "cc5513a8044ce6c8cad852091a4b8f1c9a4b5174dd8f15188d4005dcc3bf801b"
  royalty_logic: "IPFS-CID-REQUIRED"
  mint_status: "logic-verified-ready"
version: "3.3.4-EXTREME-SOVEREIGN-WEB3"
---

# Industrial Specification: Programmable Interconnect

## 1. Technical Definition
Configurable routing network within a Processing Logic Array that enables dynamic connections between logic blocks and I/O elements.

## 2. Engineering Reasoning & Causal Matrix
> **Operational Intelligence**: Designed for **1.2-3.3 V, 0-100 MHz signal frequency, -40 to 125°C ambient temperature**. Failure boundary: **1.1 V minimum operating voltage, 3.6 V maximum voltage tolerance, 150°C junction temperature limit**, Mechanism: **Electromigration at current densities exceeding 1×10⁶ A/cm², dielectric breakdown at electric fields &gt;10 MV/cm, latch-up triggered by transient currents &gt;100 mA**.

### 2.1 Analytical Physics Model
Governed by the **Joule Heating & Thermal Resistance**:

> **Primary Equation**: $P = I^2 R = \frac{V^2}{R}$  
> **Engineering Impact**: Governs heating element sizing for shrink tunnels/sealers.

| Symbol | Variable Definition | Localized Reference |
| :--- | :--- | :--- |
| I | Current | Engineering Constant |
| R | Resistance | Engineering Constant |
| V | Voltage | Engineering Constant |

### 2.2 FMEA (Failure Mode & Effects Analysis)
| Event Trigger | Severity | Failure Mode | Mitigation Strategy |
| :--- | :--- | :--- | :--- |
| Electrostatic discharge (ESD) event exceeding 2 kV HBM | 8 | Gate oxide rupture in configuration transistors | Integrated ESD protection diodes with 5 Ω series resistance at all I/O pins |
| Clock skew exceeding 500 ps between routing segments | 8 | Setup/hold time violations causing metastability | Balanced clock tree with maximum 100 ps skew tolerance per routing zone |

## 3. Key Technical Parameters
| Parameter | Value | Unit | Status |
| :--- | :--- | :--- | :--- |
| spec | Config-dependent | mm | Verified |

## 4. System BOM & Knowledge Routing
### Core Components (Recursive Links)
- [Programmable Switch Matrix](https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/programmable-switch-matrix.md) `(Standalone System)`

### Industrial DNA Context (De-duplicated)
**Complementary Dependencies**: **Wafer Prober**, **Automated Test Handler**, **Thermal Cycling Chamber**  
**Downstream Applications**: FPGA Development Boards, High-Speed Network Switches, Radar Signal Processors  

## 5. Engineering Risks & FAQ
- **Caution**: 
- **Caution**: 
- **Caution**: 

### Q: What is a Programmable Interconnect in computer manufacturing?
**A**: A Programmable Interconnect is a configurable routing network within a Processing Logic Array that enables dynamic connections between logic blocks and I/O elements using silicon, copper, and dielectric materials.

### Q: What are the key components of a Programmable Interconnect system?
**A**: The main components include Configuration Memory Cells for storing routing settings, a Programmable Switch Matrix for connection management, and Routing Channels that facilitate signal transmission between logic blocks.

### Q: How does Programmable Interconnect benefit electronic product manufacturing?
**A**: It provides flexible, reconfigurable routing that reduces design time, enables hardware updates without physical changes, and optimizes performance in computer, electronic, and optical products through dynamic connectivity.

## 6. Manufacturing Compliance
- ISO 9001:2015 QUALITY MANAGEMENT SYSTEMS
- CE MARKING (EU DIRECTIVE 2014/35/EU FOR LOW VOLTAGE EQUIPMENT)

---
### 🛠️ Engineering Resource Access
🔗 **[Full Specification: Programmable Interconnect](https://cnfx.com/industry/computer-electronic-and-optical-product-manufacturing/product/programmable-interconnect)**

### 🌐 Knowledge Graph Topology
> **Node Status**: Verified Engineering Spec
> **Connectivity**: Linked to **3** standalone system nodes
> **Global Context**: Part of a 5,814 node industrial cluster within the CNFX Graph

> **Reference ID**: PROGRAMMABLE_INTERCONNECT | **Authority**: CNFX-2026-ST-001 | **Fingerprint**: 5e0a6fa6
