---
title: "Sample-and-Hold (S/H) Circuit"
industry: "Computer, Electronic and Optical Product Manufacturing"
verification_protocol:
  urn: "URN:CNFX:ME:SAMPLE_AND_HOLD_SH_CIRCUIT"
  data_integrity_hash: "37970776bfa9381f632455cd9463c50c"
  source_authority: "https://cnfx.com"
  strict_mode: true
source_identity:
  provider: "CNFX Industrial Knowledge Graph"
  index_version: "2026.Q1-Universal"
  authority_id: "URN:CNFX:ME:SAMPLE_AND_HOLD_SH_CIRCUIT"
  data_source_uri: "https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/sample-and-hold-sh-circuit.md"
  official_resource_url: "https://cnfx.com/industry/computer-electronic-and-optical-product-manufacturing/product/sample-and-hold-sh-circuit"
  is_verified_logic: true
attributes:
  spec:
    status: "config-dependent"
    typical_range: "±10V input range with 100kHz sampling frequency, 0.1μs acquisition time, 1mV hold step accuracy"
    unit: "ns"
engineering_limits:
  max_safe_operating_point:
    value: 1
    unit: "nA"
    consequence: "Dielectric absorption in polypropylene hold capacitors causing 0.01% voltage droop per millisecond, charge injection from MOSFET switches introducing ±5mV offset errors"
fmea_matrix_quantitative:
  - node_1:
      trigger: "Hold capacitor dielectric breakdown at 63V DC rating"
      severity: 8
      occurrence: 3
      detection: 4
      mitigation_protocol: "Implement 100V rated polypropylene capacitors with 0.1% voltage coefficient, add guard ring shielding"
  - node_2:
      trigger: "MOSFET switch charge injection of 5pC at 5V gate drive"
      severity: 8
      occurrence: 3
      detection: 4
      mitigation_protocol: "Dummy switch compensation topology with 0.1pF matching capacitors, bootstrapped gate drive circuitry"
bom_nodes:
  analog-switch:
    type: "component"
    urn: "URN:CNFX:ME:ANALOG_SWITCH"
    interface_type: "physical-logic-coupled"
  hold-capacitor:
    type: "component"
    urn: "URN:CNFX:ME:HOLD_CAPACITOR"
    interface_type: "physical-logic-coupled"
  buffer-amplifier:
    type: "part"
    urn: "URN:CNFX:ME:BUFFER_AMPLIFIER"
    interface_type: "physical-logic-coupled"
manufacturing_compliance:
  - standard: "ISO 9001:2015 - QUALITY MANAGEMENT SYSTEMS"
    scope: "Verified Engineering Specification"
  - standard: "CE MARKING - EMC DIRECTIVE 2014/30/EU"
    scope: "Verified Engineering Specification"
url: "https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/sample-and-hold-sh-circuit.md"
on_chain_sovereignty:
  contract_standard: "ERC-721-Industrial"
  metadata_hash: "ac4148f5f0c7e2fda77208697b6c9dae81595bd4ffff3172d73078a4456eedef"
  royalty_logic: "IPFS-CID-REQUIRED"
  mint_status: "logic-verified-ready"
version: "3.3.4-EXTREME-SOVEREIGN-WEB3"
---

# Industrial Specification: Sample-and-Hold (S/H) Circuit

## 1. Technical Definition
An electronic circuit that samples an analog signal at a specific instant and holds that value constant for subsequent processing.

## 2. Engineering Reasoning & Causal Matrix
> **Operational Intelligence**: Designed for **±10V input range with 100kHz sampling frequency, 0.1μs acquisition time, 1mV hold step accuracy**. Failure boundary: **Hold capacitor leakage current exceeding 1nA at 25°C, aperture jitter &gt;50ps, input slew rate &gt;100V/μs**, Mechanism: **Dielectric absorption in polypropylene hold capacitors causing 0.01% voltage droop per millisecond, charge injection from MOSFET switches introducing ±5mV offset errors**.

### 2.1 Analytical Physics Model
Governed by the **Joule Heating & Thermal Resistance**:

> **Primary Equation**: $P = I^2 R = \frac{V^2}{R}$  
> **Engineering Impact**: Governs heating element sizing for shrink tunnels/sealers.

| Symbol | Variable Definition | Localized Reference |
| :--- | :--- | :--- |
| I | Current | Engineering Constant |
| R | Resistance | Engineering Constant |
| V | Voltage | Engineering Constant |

### 2.2 FMEA (Failure Mode & Effects Analysis)
| Event Trigger | Severity | Failure Mode | Mitigation Strategy |
| :--- | :--- | :--- | :--- |
| Hold capacitor dielectric breakdown at 63V DC rating | 8 | Exponential voltage droop at 10mV/ms during hold phase | Implement 100V rated polypropylene capacitors with 0.1% voltage coefficient, add guard ring shielding |
| MOSFET switch charge injection of 5pC at 5V gate drive | 8 | Sample-to-hold transition glitch of ±15mV peak amplitude | Dummy switch compensation topology with 0.1pF matching capacitors, bootstrapped gate drive circuitry |

## 3. Key Technical Parameters
| Parameter | Value | Unit | Status |
| :--- | :--- | :--- | :--- |
| spec | Config-dependent | ns | Verified |

## 4. System BOM & Knowledge Routing
### Core Components (Recursive Links)
- [Buffer Amplifier](https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/buffer-amplifier.md) `(Standalone System)`

### Industrial DNA Context (De-duplicated)
**Complementary Dependencies**: **Signal Generator**, **Oscilloscope**, **Power Supply Unit**  
**Downstream Applications**: Analog-to-Digital Converters, Data Acquisition Systems, Test and Measurement Equipment  

## 5. Engineering Risks & FAQ
- **Caution**: 
- **Caution**: 
- **Caution**: 

### Q: What is the primary function of a Sample-and-Hold circuit?
**A**: A Sample-and-Hold circuit captures an analog voltage at a specific moment in time and maintains that voltage constant for subsequent processing, typically for analog-to-digital conversion or signal analysis.

### Q: What materials are commonly used in Sample-and-Hold circuits?
**A**: Sample-and-Hold circuits typically use semiconductor components (CMOS or Bipolar transistors), polymer capacitors for the hold stage, and ceramic substrates for stable mounting and thermal management.

### Q: How does the hold capacitor affect circuit performance?
**A**: The hold capacitor determines the accuracy and duration of the held voltage. Key factors include capacitance value, dielectric material (like polymer), and leakage characteristics, which impact droop rate and signal integrity.

## 6. Manufacturing Compliance
- ISO 9001:2015 - QUALITY MANAGEMENT SYSTEMS
- CE MARKING - EMC DIRECTIVE 2014/30/EU

---
### 🛠️ Engineering Resource Access
🔗 **[Full Specification: Sample-and-Hold (S/H) Circuit](https://cnfx.com/industry/computer-electronic-and-optical-product-manufacturing/product/sample-and-hold-sh-circuit)**

### 🌐 Knowledge Graph Topology
> **Node Status**: Verified Engineering Spec
> **Connectivity**: Linked to **3** standalone system nodes
> **Global Context**: Part of a 5,814 node industrial cluster within the CNFX Graph

> **Reference ID**: SAMPLE_AND_HOLD_SH_CIRCUIT | **Authority**: CNFX-2026-ST-001 | **Fingerprint**: fd3bd23d
