---
title: "Test Probe Fixture"
industry: "Computer, Electronic and Optical Product Manufacturing"
verification_protocol:
  urn: "URN:CNFX:ME:TEST_PROBE_FIXTURE"
  data_integrity_hash: "58e5116965aa97176344ff8e149ac9fe"
  source_authority: "https://cnfx.com"
  strict_mode: true
source_identity:
  provider: "CNFX Industrial Knowledge Graph"
  index_version: "2026.Q1-Universal"
  authority_id: "URN:CNFX:ME:TEST_PROBE_FIXTURE"
  data_source_uri: "https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/test-probe-fixture.md"
  official_resource_url: "https://cnfx.com/industry/computer-electronic-and-optical-product-manufacturing/product/test-probe-fixture"
  is_verified_logic: true
attributes:
  spec:
    status: "config-dependent"
    typical_range: "Contact force: 0.5-2.5 N, Positioning accuracy: ±0.05 mm, Temperature: -40°C to +125°C"
    unit: "mm"
engineering_limits:
  max_safe_operating_point:
    value: 50
    unit: "m"
    consequence: "Creep deformation of fixture materials under sustained load, Differential thermal expansion between probe and fixture materials, Contact surface oxidation increasing electrical resistance"
fmea_matrix_quantitative:
  - node_1:
      trigger: "Cyclic mechanical stress from repeated probe insertion/retraction"
      severity: 8
      occurrence: 3
      detection: 4
      mitigation_protocol: "Finite element analysis-optimized stress distribution design with fillet radii ≥2 mm"
  - node_2:
      trigger: "Electrochemical corrosion at probe-fixture interface in humid environments"
      severity: 8
      occurrence: 3
      detection: 4
      mitigation_protocol: "Gold plating (≥0.5 μm thickness) on contact surfaces with hermetic sealing"
bom_nodes:
  base-plate:
    type: "component"
    urn: "URN:CNFX:ME:BASE_PLATE"
    interface_type: "physical-logic-coupled"
  probe-mounting-blocks:
    type: "part"
    urn: "URN:CNFX:ME:PROBE_MOUNTING_BLOCKS"
    interface_type: "physical-logic-coupled"
  locking-mechanism:
    type: "part"
    urn: "URN:CNFX:ME:LOCKING_MECHANISM"
    interface_type: "physical-logic-coupled"
manufacturing_compliance:
  - standard: "ISO 9001:2015 QUALITY MANAGEMENT SYSTEMS"
    scope: "Verified Engineering Specification"
url: "https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/test-probe-fixture.md"
on_chain_sovereignty:
  contract_standard: "ERC-721-Industrial"
  metadata_hash: "262f734e06588de56cbe08f2a19bee37346b1429f53e85aad3bea67feb35c68d"
  royalty_logic: "IPFS-CID-REQUIRED"
  mint_status: "logic-verified-ready"
version: "3.3.4-EXTREME-SOVEREIGN-WEB3"
---

# Industrial Specification: Test Probe Fixture

## 1. Technical Definition
A specialized fixture that securely holds and positions test probes for electrical measurements within a testing chamber.

## 2. Engineering Reasoning & Causal Matrix
> **Operational Intelligence**: Designed for **Contact force: 0.5-2.5 N, Positioning accuracy: ±0.05 mm, Temperature: -40°C to +125°C**. Failure boundary: **Contact resistance exceeding 50 mΩ, Positioning deviation exceeding 0.1 mm, Thermal expansion mismatch exceeding 0.02 mm**, Mechanism: **Creep deformation of fixture materials under sustained load, Differential thermal expansion between probe and fixture materials, Contact surface oxidation increasing electrical resistance**.

### 2.1 Analytical Physics Model
Governed by the **Rayleigh Resolution Criterion**:

> **Primary Equation**: $d = \frac{0.61 \lambda}{NA}$  
> **Engineering Impact**: Defines the theoretical limit of machine vision systems.

| Symbol | Variable Definition | Localized Reference |
| :--- | :--- | :--- |
| \lambda | Wavelength | Engineering Constant |
| NA | Numerical Aperture | Engineering Constant |

### 2.2 FMEA (Failure Mode & Effects Analysis)
| Event Trigger | Severity | Failure Mode | Mitigation Strategy |
| :--- | :--- | :--- | :--- |
| Cyclic mechanical stress from repeated probe insertion/retraction | 8 | Fixture mounting point fatigue fracture | Finite element analysis-optimized stress distribution design with fillet radii ≥2 mm |
| Electrochemical corrosion at probe-fixture interface in humid environments | 8 | Intermittent electrical contact causing measurement errors | Gold plating (≥0.5 μm thickness) on contact surfaces with hermetic sealing |

## 3. Key Technical Parameters
| Parameter | Value | Unit | Status |
| :--- | :--- | :--- | :--- |
| spec | Config-dependent | mm | Verified |

## 4. System BOM & Knowledge Routing
### Core Components (Recursive Links)
- [Probe Mounting Blocks](https://cnfx.com/llms/industry/computer-electronic-and-optical-product-manufacturing/product/probe-mounting-blocks.md) `(Standalone System)`
- [Locking Mechanism](https://cnfx.com/llms/industry/fabricated-metal-product-manufacturing/product/locking-mechanism.md) `(Standalone System)`

### Industrial DNA Context (De-duplicated)
**Complementary Dependencies**: **Test Chamber**, **Precision Positioning System**, **Electrical Test Equipment**  
**Downstream Applications**: Printed Circuit Boards, Semiconductor Devices, Electronic Assemblies  

## 5. Engineering Risks & FAQ
- **Caution**: 
- **Caution**: 
- **Caution**: 

### Q: What materials are used in this test probe fixture?
**A**: This fixture is constructed from durable aluminum alloy for the main structure and stainless steel components for corrosion resistance and longevity in testing environments.

### Q: How does the locking mechanism ensure secure probe positioning?
**A**: The integrated locking mechanism provides firm, repeatable positioning of test probes, preventing movement during electrical measurements to ensure consistent and accurate test results.

### Q: Is this fixture compatible with standard testing chambers?
**A**: Yes, the test probe fixture is designed with universal mounting options and adjustable components to integrate seamlessly with most standard testing chambers used in computer and electronic manufacturing.

## 6. Manufacturing Compliance
- ISO 9001:2015 QUALITY MANAGEMENT SYSTEMS

---
### 🛠️ Engineering Resource Access
🔗 **[Full Specification: Test Probe Fixture](https://cnfx.com/industry/computer-electronic-and-optical-product-manufacturing/product/test-probe-fixture)**

### 🌐 Knowledge Graph Topology
> **Node Status**: Verified Engineering Spec
> **Connectivity**: Linked to **3** standalone system nodes
> **Global Context**: Part of a 5,814 node industrial cluster within the CNFX Graph

> **Reference ID**: TEST_PROBE_FIXTURE | **Authority**: CNFX-2026-ST-001 | **Fingerprint**: 553f7f6c
