---
title: "Measurement Probe"
industry: "Machinery and Equipment Manufacturing"
verification_protocol:
  urn: "URN:CNFX:ME:MEASUREMENT_PROBE"
  data_integrity_hash: "e7ba273f41d7a333f76f048513d2fa9d"
  source_authority: "https://cnfx.com"
  strict_mode: true
source_identity:
  provider: "CNFX Industrial Knowledge Graph"
  index_version: "2026.Q1-Universal"
  authority_id: "URN:CNFX:ME:MEASUREMENT_PROBE"
  data_source_uri: "https://cnfx.com/llms/industry/machinery-and-equipment-manufacturing/product/measurement-probe.md"
  official_resource_url: "https://cnfx.com/industry/machinery-and-equipment-manufacturing/product/measurement-probe"
  is_verified_logic: true
attributes:
  spec:
    status: "config-dependent"
    typical_range: "0.1-25.0 mm thickness measurement range with ±0.5 μm resolution"
    unit: "mm"
engineering_limits:
  max_safe_operating_point:
    value: 2.5
    unit: "N"
    consequence: "Plastic deformation of tungsten carbide tip material beyond its yield strength of 4500 MPa"
fmea_matrix_quantitative:
  - node_1:
      trigger: "Electrostatic discharge exceeding 15 kV during handling"
      severity: 8
      occurrence: 3
      detection: 4
      mitigation_protocol: "ESD-protected storage containers with surface resistivity &lt;10^9 Ω/sq"
  - node_2:
      trigger: "Cyclic thermal loading from 20°C to 150°C at 5 Hz frequency"
      severity: 8
      occurrence: 3
      detection: 4
      mitigation_protocol: "Coefficient of thermal expansion matching within 1.2×10^-6/K between alumina housing and Kovar seal"
bom_nodes:
  sensing-tiphead:
    type: "component"
    urn: "URN:CNFX:ME:SENSING_TIPHEAD"
    interface_type: "physical-logic-coupled"
  transducer-element:
    type: "component"
    urn: "URN:CNFX:ME:TRANSDUCER_ELEMENT"
    interface_type: "physical-logic-coupled"
  probe-bodyhousing:
    type: "component"
    urn: "URN:CNFX:ME:PROBE_BODYHOUSING"
    interface_type: "physical-logic-coupled"
  signal-cableconnector:
    type: "component"
    urn: "URN:CNFX:ME:SIGNAL_CABLECONNECTOR"
    interface_type: "physical-logic-coupled"
manufacturing_compliance:
  - standard: "ISO 10360-2:2009 - ACCEPTANCE AND REVERIFICATION TESTS FOR COORDINATE MEASURING MACHINES (CMMS)"
    scope: "Verified Engineering Specification"
url: "https://cnfx.com/llms/industry/machinery-and-equipment-manufacturing/product/measurement-probe.md"
on_chain_sovereignty:
  contract_standard: "ERC-721-Industrial"
  metadata_hash: "aa7ead420302f57bdec7ffbfab87cf53c2de7ca90f8ea7b2eeb0d1fec8cebd8c"
  royalty_logic: "IPFS-CID-REQUIRED"
  mint_status: "logic-verified-ready"
version: "3.3.4-EXTREME-SOVEREIGN-WEB3"
---

# Industrial Specification: Measurement Probe

## 1. Technical Definition
A sensing element that directly contacts or interacts with the material surface to detect thickness variations.

## 2. Engineering Reasoning & Causal Matrix
> **Operational Intelligence**: Designed for **0.1-25.0 mm thickness measurement range with ±0.5 μm resolution**. Failure boundary: **Contact force exceeding 2.5 N causes permanent probe tip deformation**, Mechanism: **Plastic deformation of tungsten carbide tip material beyond its yield strength of 4500 MPa**.

### 2.1 Analytical Physics Model
Governed by the **Combined Measurement Uncertainty**:

> **Primary Equation**: $u_c = \sqrt{\sum u_i^2}$  
> **Engineering Impact**: Defines the precision confidence interval for inspection.

| Symbol | Variable Definition | Localized Reference |
| :--- | :--- | :--- |
| u_i | Standard Uncertainty components | Engineering Constant |

### 2.2 FMEA (Failure Mode & Effects Analysis)
| Event Trigger | Severity | Failure Mode | Mitigation Strategy |
| :--- | :--- | :--- | :--- |
| Electrostatic discharge exceeding 15 kV during handling | 8 | Piezoelectric crystal depolarization in sensing element | ESD-protected storage containers with surface resistivity &lt;10^9 Ω/sq |
| Cyclic thermal loading from 20°C to 150°C at 5 Hz frequency | 8 | Thermal expansion mismatch fracture at ceramic-metal interface | Coefficient of thermal expansion matching within 1.2×10^-6/K between alumina housing and Kovar seal |

## 3. Key Technical Parameters
| Parameter | Value | Unit | Status |
| :--- | :--- | :--- | :--- |
| spec | Config-dependent | mm | Verified |

## 4. System BOM & Knowledge Routing
### Core Components (Recursive Links)

### Industrial DNA Context (De-duplicated)
**Complementary Dependencies**: **Calibration Fixture**, **Data Acquisition System**, **Environmental Control Unit**  
**Downstream Applications**: Precision Machined Components, Quality Control Systems, Automated Assembly Lines  

## 5. Engineering Risks & FAQ
- **Caution**: 
- **Caution**: 
- **Caution**: 

### Q: What materials are used in measurement probe construction for durability?
**A**: Our measurement probes feature stainless steel bodies for corrosion resistance, ceramic tips for wear resistance in abrasive applications, and specialized elements like piezoelectric crystals or copper coils depending on the sensing technology (ultrasonic or eddy current).

### Q: How does a measurement probe detect thickness variations in manufacturing?
**A**: The probe's sensing tip directly contacts or interacts with the material surface. Transducer elements convert physical interactions into electrical signals that measure thickness differences, enabling precise quality control in machinery manufacturing processes.

### Q: What are the main components of a measurement probe assembly?
**A**: Key components include the sensing tip/head for surface interaction, transducer element for signal conversion, probe body/housing for protection and mounting, and signal cable/connector for data transmission to measurement systems.

## 6. Manufacturing Compliance
- ISO 10360-2:2009 - ACCEPTANCE AND REVERIFICATION TESTS FOR COORDINATE MEASURING MACHINES (CMMS)

---
### 🛠️ Engineering Resource Access
🔗 **[Full Specification: Measurement Probe](https://cnfx.com/industry/machinery-and-equipment-manufacturing/product/measurement-probe)**

### 🌐 Knowledge Graph Topology
> **Node Status**: Verified Engineering Spec
> **Connectivity**: Linked to **4** standalone system nodes
> **Global Context**: Part of a 5,814 node industrial cluster within the CNFX Graph

> **Reference ID**: MEASUREMENT_PROBE | **Authority**: CNFX-2026-ST-001 | **Fingerprint**: f773bb40
