Manufacturer AUTHENTICATED
Probe Card
Documented Capability Profile
URN
URN:CNFX:NODE:nidec-sv-probe:probe-card
Manufacturer
Nidec SV Probe
Asset Specifications
"An interface component in wafer testing that establishes electrical connections between test equipment and semiconductor wafer dies."
Global Location
, CN
Fulfillment Cycle
Est. 15 Days
On-Chain Metadata
Trade MOA
1 Unit(s)
Verification Hash
NODE-B1C77E0991D35E07CBD3072A99037E3C
PROTOCOL V5.2 SECURED