Search Results for "semiconductor test interface component"

3 results found

Products (3)

Probe Card
Product in Computer, Electronic and Optical Product Manufacturing
An interface component in wafer testing that establishes electrical connections between test equipment and semiconductor wafer dies.
Test Interface Unit
Product in Computer, Electronic and Optical Product Manufacturing
A critical component of a wafer prober that provides the electrical and mechanical interface between the prober's test electronics and the semiconductor wafer under test.
Test Socket
Product in Computer, Electronic and Optical Product Manufacturing
A precision interface component in automated test handlers that provides electrical and mechanical connection between test equipment and semiconductor devices under test.

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