D Flip-Flop Cell: Power Supply 1.2 V, Hold Time 30 ps

Component Specifications

Definition

A D flip-flop cell is a bistable multivibrator circuit element that stores one binary bit (0 or 1). It features a data input (D), a clock input (CLK), and outputs (Q and Q'). The cell captures the value present at the D input at the moment of a specified clock transition (typically rising or falling edge) and holds it stable at the Q output until the next clock event. It forms the basic building block for registers, counters, and memory elements in digital systems like the D Flip-Flop Array machine.

Working Principle

The D flip-flop operates on edge-triggered clocking. When the clock signal transitions (e.g., from low to high), the logic level at the D input is sampled and transferred to the Q output. This value remains latched, unaffected by changes at D, until the next clock edge. Internally, it often uses cross-coupled gates (like NAND or NOR) to create feedback that maintains state.

Materials

Semiconductor materials: Silicon (Si) with dopants (e.g., boron, phosphorus) for transistors; dielectric layers (e.g., silicon dioxide); metal interconnects (e.g., aluminum, copper). Packaging: Ceramic or plastic encapsulant with lead frames or solder balls.

Technical Parameters

Parameter	Typical range	Notes & selection driver
Hold Time	30 ps
Setup Time	50 ps
Output Drive	4 mA
Power Supply	1.2 V
Clock Frequency	Up to 5 GHz
Propagation Delay	100 ps
Operating Temperature	-40°C to 125°C

Ranges are indicative industry figures for RFQ preparation, not a supplier commitment. Confirm every value and standard with the legal manufacturer before ordering.

Standards

IEC 60747, JEDEC JESD78

Parent Products

This component is used in the following industrial products

D Flip-Flop Array

A digital circuit component consisting of multiple D flip-flops arranged in an array configuration for parallel data storage and transfer.

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Engineering Analysis

Risks & Mitigation

Clock skew causing timing violations
Metastability from asynchronous inputs
Power supply noise affecting stability
Electrostatic discharge (ESD) damage

FMEA Triads

Trigger: Clock signal delay variation
Failure: Setup or hold time violation
Mitigation: Use balanced clock tree synthesis and timing analysis tools

Trigger: Voltage spike on power rail
Failure: Data corruption or latch-up
Mitigation: Implement decoupling capacitors and robust power distribution

Industrial Ecosystem

Compatible With

Typical Suppliers & Equivalents

Compliance & Inspection

Tolerance

±5% for timing parameters, ±10% for voltage levels

Test Method

Automated test equipment (ATE) with vector patterns, scan chain testing, and boundary scan (JTAG)

Procurement Evaluation Criteria

A practical evidence checklist for RFQ preparation and supplier evaluation.

Technical documentation

Request current drawings, revision history, and a signed specification sheet.

Manufacturing capability

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Inspection readiness

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Manufacturers of D Flip-Flop Cell

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Frequently Asked Questions

What is the difference between a D flip-flop and a latch?

A D flip-flop is edge-triggered, capturing data only on a clock transition, while a latch is level-sensitive, transparent when the enable signal is active, making flip-flops better for synchronous design.

How is a D flip-flop cell used in a D Flip-Flop Array machine?

Multiple D flip-flop cells are integrated into an array to form registers or memory blocks, enabling parallel data storage and processing in digital systems like CPUs or FPGAs.

Data Basis

Editorial classification, named public sources where available, and source-reviewed manufacturer records. See the editorial policy.

Preliminary Technical Classification

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D Flip-Flop Cell