Non-volatile flash memory chips using NAND gate architecture for data storage in electronic devices.
| Parameter | Typical range | Notes & selection driver |
|---|---|---|
| Capacity | 64GB to 2TB | |
| Cell Type | SLC, MLC, TLC, QLC | |
| Endurance | 100-10,000 P/E cycles | |
| Interface | ONFI, Toggle Mode, UFS, NVMe | |
| Data Retention | Up to 10 years | |
| Operating Voltage | 1.8V, 3.3V | |
| Operating Temperature | -40°C to 85°C |
Ranges are indicative industry figures for RFQ preparation, not a supplier commitment. Confirm every value and standard with the legal manufacturer before ordering.
This component is used in the following industrial products
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NAND flash has higher density and faster write/erase speeds but slower random access, making it ideal for mass storage. NOR flash offers faster random access and execute-in-place capability but lower density, suitable for code storage.
Wear leveling distributes write/erase cycles evenly across memory blocks using algorithms, preventing premature failure of frequently written blocks and maximizing overall endurance.
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