INDUSTRY COMPONENT

Parallel Output Register/Latch

A parallel output register/latch is a digital storage component that captures and holds multiple bits simultaneously from a serial input stream, outputting them in parallel format.

Component Specifications

Definition
The parallel output register/latch is a critical component in deserializer (serial-in parallel-out) systems, designed to temporarily store digital data bits received serially and present them simultaneously on multiple output lines. It functions as an intermediate buffer that synchronizes data conversion from serial to parallel formats, ensuring stable output signals for downstream processing units. This component typically features clock-controlled latching mechanisms, enabling precise timing for data capture and retention during transmission cycles.
Working Principle
The register/latch operates by receiving serial data bits sequentially through a single input line. Upon receiving a clock signal or control pulse, it captures the current state of the input and stores it internally. Multiple bits are accumulated over successive clock cycles until the register is full. Once the required number of bits is stored, all bits are simultaneously presented on parallel output lines. The latching mechanism maintains the output state until the next update cycle, preventing data corruption during read operations.
Materials
Semiconductor materials (silicon, gallium arsenide), copper interconnects, dielectric layers (SiO2, Si3N4), encapsulation materials (epoxy molding compounds), lead frame alloys (copper alloys, Alloy 42)
Technical Parameters
ParameterTypical rangeNotes & selection driver
Bit Width4-bit to 64-bit
Hold Time0.3 ns
Setup Time0.5 ns
Package TypeQFN, BGA, SOIC
Power Supply1.2V to 3.3V
Clock FrequencyUp to 5 GHz
Propagation Delay< 1 ns
Operating Temperature-40°C to 125°C

Ranges are indicative industry figures for RFQ preparation, not a supplier commitment. Confirm every value and standard with the legal manufacturer before ordering.

Standards
IEC 60747, JEDEC JESD78

Parent Products

This component is used in the following industrial products

Engineering Analysis

Risks & Mitigation
  • Clock skew causing data corruption
  • Metastability during asynchronous inputs
  • Power supply noise affecting output stability
  • Thermal issues at high frequencies
FMEA Triads
Trigger: Clock signal jitter exceeding timing margins
Failure: Incorrect data capture leading to parallel output errors
Mitigation: Implement clock conditioning circuits with jitter attenuation and use setup/hold time guard bands
Trigger: Power supply voltage droop during switching
Failure: Output signal degradation and potential logic errors
Mitigation: Incorporate decoupling capacitors near power pins and implement power integrity analysis

Industrial Ecosystem

Compatible With

Typical Suppliers & Equivalents

Compliance & Inspection

Tolerance
±5% for timing parameters, ±2% for voltage levels
Test Method
JEDEC JESD22 test methods for electrical characteristics, including propagation delay measurement using high-speed oscilloscopes and bit error rate testing with pattern generators

Procurement Evaluation Criteria

A practical evidence checklist for RFQ preparation and supplier evaluation.

Technical documentation
Request current drawings, revision history, and a signed specification sheet.
Manufacturing capability
Verify equipment lists, process limits, capacity, and representative production evidence.
Inspection readiness
Confirm test methods, calibrated equipment, sampling plans, and traceable reports.
Supplier transparency
Check the legal entity, factory address, ownership, certifications, and direct contacts.

CNFX does not score or rank suppliers. Buyers must verify all claims and documents with the legal manufacturer before ordering.

Manufacturers of Parallel Output Register/Latch

Manufacturer profiles associated with Parallel Output Register/Latch.

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Frequently Asked Questions

What is the difference between a register and a latch in this context?

In deserializer applications, registers are typically edge-triggered (capture data on clock edges) while latches are level-sensitive (transparent when enable signal is active). Both serve similar storage functions but differ in timing behavior.

How does clock synchronization affect parallel output performance?

Clock synchronization ensures all bits are captured simultaneously, minimizing skew between output lines. Proper clock distribution is critical for maintaining data integrity during high-speed serial-to-parallel conversion.

Data Basis

Editorial classification, named public sources where available, and source-reviewed manufacturer records. See the editorial policy.

Preliminary Technical Classification
This page supports structured research, RFQ preparation, and supplier evaluation. It does not replace buyer-led supplier qualification, standards review, or technical approval.

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