Secondary flat is a precision reference surface on gallium arsenide wafers used for crystal orientation alignment in semiconductor manufacturing.
| Parameter | Typical range | Notes & selection driver |
|---|---|---|
| Depth | 0.5-1.0 mm | |
| Width | 1.5-3.0 mm | |
| Length | 15-30 mm | |
| Edge Chamfer | 0.1-0.3 mm | |
| Angular Tolerance | ±0.5° | |
| Position Accuracy | ±0.1 mm | |
| Surface Roughness | <0.5 nm Ra |
Ranges are indicative industry figures for RFQ preparation, not a supplier commitment. Confirm every value and standard with the legal manufacturer before ordering.
This component is used in the following industrial products
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The primary flat indicates the crystal plane orientation and is typically longer, while the secondary flat provides additional orientation information (doping type or specific crystal direction) and is shorter. Their angular relationship determines the exact crystallographic orientation.
Accurate secondary flat positioning ensures proper alignment of epitaxial layers and device structures with crystal planes, which directly affects electron mobility, optical properties, and device performance in GaAs-based semiconductors.
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