Products (10)
Product
in Computer, Electronic and Optical Product Manufacturing
A specialized electrical connector designed for Automated Test Equipment (ATE) systems, used to interface between test instruments and the device under test (DUT) on an Interface PCB.
Product
in Computer, Electronic and Optical Product Manufacturing
A printed circuit board designed specifically for interfacing between test equipment and devices under test within a test fixture system.
Product
in Computer, Electronic and Optical Product Manufacturing
Electronic interface cards that provide signal generation, measurement, and switching capabilities for testing semiconductor devices in automated test equipment.
Product
in Computer, Electronic and Optical Product Manufacturing
An interface component in wafer testing that establishes electrical connections between test equipment and semiconductor wafer dies.
Product
in Computer, Electronic and Optical Product Manufacturing
Electrical and mechanical interface connecting the probe card to the test head/controller in semiconductor testing equipment
Product
in Computer, Electronic and Optical Product Manufacturing
A specialized circuit board within a probe card interface that transmits electrical signals between the test equipment and semiconductor wafer during testing.
Product
in Computer, Electronic and Optical Product Manufacturing
Interface component connecting test equipment to device under test (DUT) boards in burn-in testing systems
Product
in Computer, Electronic and Optical Product Manufacturing
Physical and electrical interface component that connects the Device Under Test (DUT) to automated test equipment for functional and parametric testing.
Product
in Computer, Electronic and Optical Product Manufacturing
Interface and control unit for automated test equipment that connects test instruments to devices under test
Product
in Computer, Electronic and Optical Product Manufacturing
A precision interface component in automated test handlers that provides electrical and mechanical connection between test equipment and semiconductor devices under test.