Precision substrate used as reference surface in calibration targets for optical and measurement systems.
| Parameter | Typical range | Notes & selection driver |
|---|---|---|
| Flatness | ≤ 1 μm over 100 mm | |
| Surface Hardness | ≥ 6 Mohs (glass/ceramic) or ≥ 40 HRC (metal) | |
| Maximum Dimension | Up to 300×300 mm standard | |
| Surface Roughness | Ra ≤ 0.05 μm | |
| Thickness Tolerance | ± 0.01 mm | |
| Thermal Expansion Coefficient | < 5×10⁻⁶/K |
Ranges are indicative industry figures for RFQ preparation, not a supplier commitment. Confirm every value and standard with the legal manufacturer before ordering.
This component is used in the following industrial products
A practical evidence checklist for RFQ preparation and supplier evaluation.
Compare the published product scope and source details, then include your specifications and quantity in an enquiry.
Manufacturer profiles associated with Base Substrate.
Explore company information and manufacturing capabilities, then discuss the scope of your project with a relevant supplier.
The Base Substrate provides a dimensionally stable, flat reference surface that ensures calibration patterns maintain accurate spatial relationships and positions during measurement system calibration.
Material selection impacts thermal stability, surface finish quality, durability, and compatibility with calibration marking methods. Low-CTE materials like fused quartz minimize thermal drift, while ceramics offer excellent hardness and chemical resistance.
Regular cleaning with appropriate solvents, protection from mechanical damage, storage in controlled environments (temperature/humidity), and periodic verification of flatness using interferometry or precision straightedges.
Editorial classification, named public sources where available, and source-reviewed manufacturer records. See the editorial policy.