Individual Latch/Register: Temperature Range -40°C to 125°C

Component Specifications

Definition

An Individual Latch/Register is a sequential logic circuit element used in digital electronics to store one bit of binary data. It operates based on control signals (clock, enable) to capture and maintain data values, serving as basic building blocks in registers, memory units, and data processing systems within the Latch/Register Bank machine architecture.

Working Principle

Operates using flip-flop circuits that change state based on control inputs. Data input (D) is captured when the clock signal transitions (edge-triggered) or enable signal is active (level-sensitive), and the stored value remains stable until the next valid capture event, providing temporary data retention and synchronization.

Materials

Semiconductor materials (silicon, gallium arsenide), copper interconnects, dielectric layers, with packaging using epoxy molding compounds, ceramic substrates, or plastic encapsulation.

Technical Parameters

Parameter	Typical range	Notes & selection driver
Hold Time	30 ps
Data Width	1 bit
Setup Time	50 ps
Clock Frequency	Up to 5 GHz
Operating Voltage	1.2V-3.3V
Power Consumption	5 mW
Propagation Delay	100 ps
Temperature Range	-40°C to 125°C

Ranges are indicative industry figures for RFQ preparation, not a supplier commitment. Confirm every value and standard with the legal manufacturer before ordering.

Standards

IEC 60747, JEDEC JESD78

Parent Products

This component is used in the following industrial products

Latch/Register Bank

A digital circuit component that stores and manages multiple binary data values within a quantizer/comparator network.

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Engineering Analysis

Risks & Mitigation

Timing violations causing metastability
Clock skew affecting synchronization
Power supply noise inducing errors
Electrostatic discharge damage
Thermal stress reducing reliability

FMEA Triads

Trigger: Insufficient setup/hold time margins
Failure: Metastable output states causing system errors
Mitigation: Implement proper timing constraints, use synchronization circuits, add timing margin in design

Trigger: Power supply voltage fluctuations
Failure: Data corruption or loss during operation
Mitigation: Implement voltage regulation, add decoupling capacitors, design with noise margins

Trigger: Electrostatic discharge (ESD) events
Failure: Permanent damage to semiconductor structure
Mitigation: Implement ESD protection circuits, follow proper handling procedures, use anti-static packaging

Industrial Ecosystem

Compatible With

Typical Suppliers & Equivalents

Compliance & Inspection

Tolerance

±5% for timing parameters, ±2% for voltage specifications

Test Method

Automated test equipment (ATE) with vector testing, boundary scan (JTAG), functional verification at temperature extremes

Procurement Evaluation Criteria

A practical evidence checklist for RFQ preparation and supplier evaluation.

Technical documentation

Request current drawings, revision history, and a signed specification sheet.

Manufacturing capability

Verify equipment lists, process limits, capacity, and representative production evidence.

Inspection readiness

Confirm test methods, calibrated equipment, sampling plans, and traceable reports.

Supplier transparency

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Manufacturers of Individual Latch/Register

Manufacturer profiles associated with Individual Latch/Register.

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Compiled and source-reviewed by the CNFX editorial team. Each manufacturer above links to the page on that company's own website where the product is listed, with the date we checked it. How we source and review

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Frequently Asked Questions

What is the difference between a latch and a register?

Latches are level-sensitive storage elements that transparently pass data when enabled, while registers are edge-triggered devices that capture data only on clock transitions, providing better synchronization in digital systems.

How does setup time affect latch/register performance?

Setup time is the minimum period data must be stable before the clock edge. Insufficient setup time can cause metastability and data corruption, requiring careful timing analysis in high-speed applications.

Data Basis

Editorial classification, named public sources where available, and source-reviewed manufacturer records. See the editorial policy.

Preliminary Technical Classification

This page supports structured research, RFQ preparation, and supplier evaluation. It does not replace buyer-led supplier qualification, standards review, or technical approval.

Individual Latch/Register