INDUSTRY COMPONENT

Individual Latch/Register

Individual Latch/Register is a fundamental digital storage component that temporarily holds binary data in electronic systems.

Component Specifications

Definition
An Individual Latch/Register is a sequential logic circuit element used in digital electronics to store one bit of binary data. It operates based on control signals (clock, enable) to capture and maintain data values, serving as basic building blocks in registers, memory units, and data processing systems within the Latch/Register Bank machine architecture.
Working Principle
Operates using flip-flop circuits that change state based on control inputs. Data input (D) is captured when the clock signal transitions (edge-triggered) or enable signal is active (level-sensitive), and the stored value remains stable until the next valid capture event, providing temporary data retention and synchronization.
Materials
Semiconductor materials (silicon, gallium arsenide), copper interconnects, dielectric layers, with packaging using epoxy molding compounds, ceramic substrates, or plastic encapsulation.
Technical Parameters
  • Hold Time 30 ps
  • Data Width 1 bit
  • Setup Time 50 ps
  • Clock Frequency Up to 5 GHz
  • Operating Voltage 1.2V-3.3V
  • Power Consumption 5 mW
  • Propagation Delay 100 ps
  • Temperature Range -40°C to 125°C
Standards
ISO 9001, IEC 60747, JEDEC JESD78

Industry Taxonomies & Aliases

Commonly used trade names and technical identifiers for Individual Latch/Register.

Parent Products

This component is used in the following industrial products

Engineering Analysis

Risks & Mitigation
  • Timing violations causing metastability
  • Clock skew affecting synchronization
  • Power supply noise inducing errors
  • Electrostatic discharge damage
  • Thermal stress reducing reliability
FMEA Triads
Trigger: Insufficient setup/hold time margins
Failure: Metastable output states causing system errors
Mitigation: Implement proper timing constraints, use synchronization circuits, add timing margin in design
Trigger: Power supply voltage fluctuations
Failure: Data corruption or loss during operation
Mitigation: Implement voltage regulation, add decoupling capacitors, design with noise margins
Trigger: Electrostatic discharge (ESD) events
Failure: Permanent damage to semiconductor structure
Mitigation: Implement ESD protection circuits, follow proper handling procedures, use anti-static packaging

Industrial Ecosystem

Compatible With

Interchangeable Parts

Compliance & Inspection

Tolerance
±5% for timing parameters, ±2% for voltage specifications
Test Method
Automated test equipment (ATE) with vector testing, boundary scan (JTAG), functional verification at temperature extremes

Buyer Feedback

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"The technical documentation for this Individual Latch/Register is very thorough, especially regarding technical reliability."

"Reliable performance in harsh Computer, Electronic and Optical Product Manufacturing environments. No issues with the Individual Latch/Register so far."

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Frequently Asked Questions

What is the difference between a latch and a register?

Latches are level-sensitive storage elements that transparently pass data when enabled, while registers are edge-triggered devices that capture data only on clock transitions, providing better synchronization in digital systems.

How does setup time affect latch/register performance?

Setup time is the minimum period data must be stable before the clock edge. Insufficient setup time can cause metastability and data corruption, requiring careful timing analysis in high-speed applications.

Can I contact factories directly?

Yes, each factory profile provides direct contact information.

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