Editorial Technical Reference

Latch/Register Bank

This page explains how Latch/Register Bank is classified within Computer, Electronic and Optical Product Manufacturing. Technical values and manufacturer relationships are research references; confirm the current specification and supplier evidence for each order.

Technical Definition & Core Assembly

A digital circuit component that stores and manages multiple binary data values within a quantizer/comparator network.

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Product Specifications

Technical details and manufacturing context for Latch/Register Bank

Definition
A latch/register bank is a critical component within quantizer/comparator networks that provides temporary storage for digital data during signal processing operations. It consists of multiple latches or registers arranged in parallel, allowing simultaneous storage and retrieval of multiple data bits or words. In quantizer/comparator systems, it typically holds intermediate comparison results, threshold values, or quantization levels, enabling pipelined processing and reducing data access bottlenecks. The bank is fabricated using silicon, with copper and aluminum interconnects, and is available in surface-mount packages such as SOIC-16 to TSSOP-20. Key electrical parameters include a supply voltage range of 3.3–5.0 V, operating temperature from -40 to 85 °C, and storage temperature from -55 to 125 °C. Logic levels follow CMOS standards with input high voltage of 2.0–5.5 V and input low voltage of 0–0.8 V, while output high and low voltages are 2.4–5.5 V and 0–0.4 V, respectively. Propagation delay ranges from 1.5 to 10 ns, and maximum clock frequency is 100–200 MHz. Input capacitance is 2–10 pF per pin, and output drive current is ±4 to ±24 mA. Total power dissipation is 0.5–2.5 W, and ESD tolerance is 2000–8000 V (HBM). These values are reference ranges and must be verified for the specific model and application. The device is intended for use in quantizer/comparator networks, where it buffers comparison results and quantization parameters, interfacing with analog-to-digital converters and digital signal processors. It is not a standalone product but a component for integration into larger systems. Always consult the manufacturer's datasheet for exact specifications and compliance with relevant standards.
Working Principle
The latch/register bank operates by using clock signals to control when data is captured and stored. Each latch or register in the bank can be individually addressed or controlled to store binary values. When enabled, input data is latched and held until the next clock cycle or control signal. In quantizer/comparator applications, it often interfaces with analog-to-digital converters and digital signal processors to buffer comparison results and quantization parameters. The bank supports parallel data storage and retrieval, enabling simultaneous processing of multiple bits or words. The clock frequency and propagation delay determine the speed of data capture and output. The device is designed for use in digital signal processing chains, where it helps manage data flow and reduce bottlenecks. Proper operation requires correct supply voltage and logic levels, and the device must be operated within specified temperature and electrical limits to ensure reliable performance.
Common Materials
silicon, copper, aluminum
Technical Parameters
ParameterTypical rangeNotes & selection driver
Supply Voltage3.3–5.0 VOperating range for logic levelsIEC 60664
Operating Temperature-40–85 °CExtended industrial rangeIEC 60068-2-1
Storage Temperature-55–125 °CNon-operating survival rangeIEC 60068-2-2
Input High Voltage2.0–5.5 VVIH for CMOS logicJEDEC JESD8
Input Low Voltage0–0.8 VVIL for CMOS logicJEDEC JESD8
Output High Voltage2.4–5.5 VVOH at specified loadJEDEC JESD8
Output Low Voltage0–0.4 VVOL at specified loadJEDEC JESD8
Propagation Delay1.5–10 nsTypical for CMOS technologyJEDEC JESD8
Maximum Clock Frequency100–200 MHzDepends on supply voltage and loadJEDEC JESD8
Input Capacitance2–10 pFPer input pinJEDEC JESD8
Output Drive Current±4–±24 mASink/source capabilityJEDEC JESD8
Power Dissipation0.5–2.5 WTotal for all channelsJEDEC JESD8
ESD Tolerance2000–8000 VHBM modelIEC 61000-4-2
Package TypeSOIC-16–TSSOP-20Surface mount optionsJEDEC MS-012

Ranges are indicative industry figures for RFQ preparation, not a supplier commitment. Confirm every value and standard with the legal manufacturer before ordering.

Components / BOM

Applied To / Applications

This component is essential for the following industrial systems and equipment:

Quantizer/Comparator Network
View system integration details

Industrial Ecosystem & Supply Chain Structure

Complementary Systems
Downstream Applications
Specialized Tooling

Application Fit & Sizing Matrix

Operational Limits
pressure: N/A (solid-state component)
temperature: -40°C to 125°C
voltage range: 1.8V to 5.5V
clock frequency: Up to 500 MHz
Media Compatibility
✓ Digital signal processing systems ✓ Analog-to-digital converter (ADC) control logic ✓ Data acquisition system timing circuits
Unsuitable: High-voltage or high-current power switching environments
Sizing Data Required
  • Number of bits/registers required
  • Clock frequency/sampling rate
  • Power supply voltage and power consumption constraints

Reliability & Engineering Risk Analysis

Failure Mode & Root Cause
Metastable latch output when the comparator sits at its threshold
Cause: In a quantizer the input frequently lands arbitrarily close to a decision level, so the latch is clocked while its inputs are balanced; it then takes an unbounded time to resolve and the following stage can read a level that is neither logic high nor low
Code errors from skew between the bank's latches
Cause: The latches of the bank are clocked through paths of unequal delay, so bits of the same conversion are captured at slightly different instants and the assembled code corresponds to no single input sample
Maintenance Indicators
  • Isolated wrong codes that appear near the transition points of the transfer characteristic and disappear when the sampling rate is reduced
  • Bit error rate rises with sampling rate while the analogue input and reference are unchanged
Engineering Tips
  • Allow an explicit resolution interval between the latch and the first logic that uses its output, and size it from the measured resolution time constant rather than from a rule of thumb
  • Balance the clock distribution across the whole bank and verify the residual skew against the conversion rate, since the error appears as wrong codes rather than as a timing violation report

Indicative industry ranges for design and RFQ preparation. Confirm the exact figures and applicable standard with the manufacturer before specifying.

Compliance & Manufacturing Standards

Applicable Standards
JEDEC JESD22 series: reliability qualification test methods for semiconductor devices

Quoted from the published standard.

Manufacturing Precision
  • Resolution time must give a mean time between failures above the specified target at the maximum sampling rate
  • Setup and hold margins must be met at every specified corner, not only at nominal conditions
Quality Inspection
  • Metastability characterisation: the comparator input is driven arbitrarily close to the decision threshold and the resolution time of the capture latch is measured
  • Setup and hold verification of the capture path across all specified process, voltage and temperature corners

Manufacturers of Latch/Register Bank

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Frequently Asked Questions

What is the primary function of a latch/register bank?

It provides temporary storage for multiple binary data values within a quantizer/comparator network, holding intermediate results, thresholds, or quantization levels to enable pipelined processing.

What are the typical supply voltage and temperature ranges?

The supply voltage range is 3.3–5.0 V, operating temperature is -40 to 85 °C, and storage temperature is -55 to 125 °C. These are reference ranges; verify for the specific model.

How does the latch/register bank interface with other components?

It interfaces with analog-to-digital converters and digital signal processors, buffering comparison results and quantization parameters. It uses clock signals to control data capture and storage.

What standards are relevant for verification?

Relevant standards include IEC 60664 for supply voltage, IEC 60068-2-1 and IEC 60068-2-2 for temperature, JEDEC JESD8 for logic levels, and IEC 61000-4-2 for ESD. Always confirm compliance with the manufacturer.
Data basis: editorial classification, named public sources where available, and source-reviewed manufacturer records. See the editorial policy.

Data Basis

Editorial classification, named public sources where available, and source-reviewed manufacturer records.

Preliminary Technical Classification
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