Semiconductor Junction: Breakdown Voltage 20-100 V

Component Specifications

Definition

A semiconductor junction, specifically a p-n junction, is a critical component in photodiodes where two differently doped semiconductor regions (p-type and n-type) meet. This junction creates a depletion region with an internal electric field that separates electron-hole pairs generated by incident photons, producing a photocurrent proportional to light intensity.

Working Principle

When photons with sufficient energy strike the semiconductor junction, they generate electron-hole pairs. The internal electric field in the depletion region separates these charge carriers, causing electrons to move toward the n-region and holes toward the p-region, creating a measurable photocurrent or voltage across the junction.

Materials

Typically silicon (Si), germanium (Ge), or III-V compounds like gallium arsenide (GaAs) and indium gallium arsenide (InGaAs), doped with elements such as boron (p-type) and phosphorus (n-type).

Technical Parameters

Parameter	Typical range	Notes & selection driver
Rise Time	1-100 ns
Dark Current	1 nA to 10 μA
Responsivity	0.5-1.0 A/W
Wavelength Range	400-1100 nm (Si), 800-1700 nm (InGaAs)
Breakdown Voltage	20-100 V
Junction Capacitance	1-100 pF

Ranges are indicative industry figures for RFQ preparation, not a supplier commitment. Confirm every value and standard with the legal manufacturer before ordering.

Standards

ISO 10110, DIN 5031

Parent Products

This component is used in the following industrial products

Photodiode Receiver

A semiconductor device that converts infrared light signals into electrical current within an optical port system.

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Engineering Analysis

Risks & Mitigation

Thermal runaway at high temperatures
Degradation from excessive reverse bias
Contamination during manufacturing affecting junction properties

FMEA Triads

Trigger: High reverse bias voltage
Failure: Junction breakdown leading to permanent damage
Mitigation: Implement voltage clamping circuits and adhere to maximum ratings

Trigger: Exposure to high-intensity light
Failure: Saturation or burnout of the junction
Mitigation: Use optical filters and limit operating light levels

Trigger: Manufacturing defects like doping irregularities
Failure: Reduced responsivity or increased dark current
Mitigation: Strict quality control and testing during fabrication

Industrial Ecosystem

Compatible With

Photodiode receivers, optical sensors, light meters, fiber optic communication systems

Typical Suppliers & Equivalents

Hamamatsu, Thorlabs, OSI Optoelectronics, First Sensor

Compliance & Inspection

Tolerance

±5% for responsivity, ±10% for dark current under standard test conditions

Test Method

IEC 60747-5 for photoelectric characteristics, including spectral response and linearity measurements

Procurement Evaluation Criteria

A practical evidence checklist for RFQ preparation and supplier evaluation.

Technical documentation

Request current drawings, revision history, and a signed specification sheet.

Manufacturing capability

Verify equipment lists, process limits, capacity, and representative production evidence.

Inspection readiness

Confirm test methods, calibrated equipment, sampling plans, and traceable reports.

Supplier transparency

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Manufacturers of Semiconductor Junction

Manufacturer profiles associated with Semiconductor Junction.

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Frequently Asked Questions

What is the role of a semiconductor junction in a photodiode?

It converts incident light into electrical current by separating electron-hole pairs generated in the depletion region.

How does doping affect the semiconductor junction?

Doping creates p-type and n-type regions with excess holes or electrons, forming the junction and establishing the internal electric field essential for charge separation.

What materials are commonly used for semiconductor junctions in photodiodes?

Silicon for visible to near-infrared, germanium for infrared, and III-V compounds like GaAs and InGaAs for specific wavelength optimizations.

Data Basis

Editorial classification, named public sources where available, and source-reviewed manufacturer records. See the editorial policy.

Preliminary Technical Classification

This page supports structured research, RFQ preparation, and supplier evaluation. It does not replace buyer-led supplier qualification, standards review, or technical approval.

Semiconductor Junction