Editorial Technical Reference

Clock Data Recovery Circuit

This page explains how Clock Data Recovery Circuit is classified within Computer, Electronic and Optical Product Manufacturing. Technical values and manufacturer relationships are research references; confirm the current specification and supplier evidence for each order.

Technical Definition & Core Assembly

A circuit that extracts and reconstructs a clock signal from a serial data stream, enabling synchronous data sampling in communication systems.

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Product Specifications

Technical details and manufacturing context for Clock Data Recovery Circuit

Definition
The Clock Data Recovery (CDR) circuit is a component used in high-speed serial communication systems, particularly within Analog-to-Digital Converters (ADCs) and deserializers. Its primary function is to generate a stable, synchronized clock signal directly from the incoming serial data stream. This recovered clock is essential for accurately sampling data bits at the optimal moment, compensating for timing jitter, frequency drift, and phase misalignment between transmitter and receiver. By doing so, it ensures reliable data transmission and conversion. The circuit typically employs a phase-locked loop (PLL) or delay-locked loop (DLL) architecture. It compares the phase of incoming data transitions with that of a locally generated clock from a voltage-controlled oscillator (VCO). A phase detector produces an error signal proportional to the phase difference, which is filtered and used to adjust the VCO's frequency and phase, locking it to the average frequency and phase of the incoming data stream. Once locked, the recovered clock triggers sampling of data bits in the subsequent data path. The CDR supports data rates from 0.1 to 12.5 Gbps, operates from a single 1.8–3.3 V supply, and consumes 50–150 mW at maximum data rate. It offers jitter tolerance of 0.5–1.0 UI peak-to-peak at a bit error rate (BER) of 1e-12, lock time from 0.1 to 10 ms, and operates over -40 to 85 °C. Input sensitivity is 50–200 mV differential peak-to-peak, and output swing is 400–800 mV differential, selectable. The device is available in a 4x4 mm QFN-32 package, RoHS compliant, and has an ESD rating of ±2 kV (HBM) per IEC 61000-4-2. Materials include silicon substrate, copper interconnects, and dielectric insulation. These specifications are reference ranges; verify model-specific values with the manufacturer.
Working Principle
The CDR circuit uses a phase-locked loop (PLL) or delay-locked loop (DLL) to recover a clock from the data stream. A phase detector compares the phase of incoming data transitions with a locally generated clock from a voltage-controlled oscillator (VCO). The resulting error signal is filtered and applied to the VCO, adjusting its frequency and phase to match the average of the incoming data. Once locked, the recovered clock is used to sample data bits at the optimal point, ensuring accurate data recovery.
Common Materials
Silicon (Semiconductor substrate), Copper (Interconnects), Dielectric materials (Insulation)
Technical Parameters
ParameterTypical rangeNotes & selection driver
Data Rate0.1–12.5 GbpsSupports common serial standards
Supply Voltage1.8–3.3 VSingle supply operation
Power Consumption50–150 mWAt max data rate
Jitter Tolerance0.5–1.0 UIPeak-to-peak at BER 1e-12
Lock Time0.1–10 msFrom power-up or reset
Operating Temperature-40–85 °CIndustrial grade
Input Sensitivity50–200 mVDifferential peak-to-peak
Output Swing400–800 mVDifferential, selectable
Package TypeQFN-324x4 mm, RoHS compliant
ESD Rating±2 kVHBMIEC 61000-4-2

Ranges are indicative industry figures for RFQ preparation, not a supplier commitment. Confirm every value and standard with the legal manufacturer before ordering.

Components / BOM
  • Phase Detector / Phase Frequency Detector (PFD)
    Compares the phase (and sometimes frequency) of the incoming data transitions with the feedback clock from the VCO and generates an error signal.
    Material: Semiconductor (CMOS/BiCMOS transistors)
  • Charge Pump & Loop Filter
    Converts the phase detector's digital error signals into an analog control voltage. The loop filter smooths this voltage to set the dynamics (bandwidth, stability) of the PLL.
    Material: Semiconductor (transistors, capacitors, resistors)
  • Voltage-Controlled Oscillator (VCO)
    Generates the local clock signal. Its oscillation frequency is controlled by the voltage from the loop filter.
    Material: Semiconductor (inductors, varactors, transistors)
  • Frequency Divider
    Divides the high-frequency VCO output down to a lower frequency for comparison in the phase detector, setting the multiplication ratio of the PLL.
    Material: Semiconductor (digital logic gates)

Applied To / Applications

This component is essential for the following industrial systems and equipment:

Industrial Ecosystem & Supply Chain Structure

Complementary Systems
Downstream Applications
Specialized Tooling

Application Fit & Sizing Matrix

Operational Limits
pressure: N/A (solid-state electronic component)
other spec: Data rate range: 1 Mbps to 10 Gbps, Jitter tolerance: < 0.1 UI, Power supply: 1.8V to 3.3V
temperature: -40°C to +85°C (industrial grade), -40°C to +125°C (extended)
Media Compatibility
✓ Fiber optic communication systems ✓ High-speed serial data links (e.g., PCIe, SATA) ✓ Telecommunication backplane interfaces
Unsuitable: High electromagnetic interference (EMI) environments without proper shielding
Sizing Data Required
  • Data rate (bps)
  • Jitter specification (UI or ps)
  • Input signal amplitude (mVpp)

Reliability & Engineering Risk Analysis

Failure Mode & Root Cause
Clock Jitter Degradation
Cause: Power supply noise, temperature fluctuations, or aging of voltage-controlled oscillator (VCO) components leading to timing instability.
Phase-Locked Loop (PLL) Lock Loss
Cause: Signal integrity issues (e.g., electromagnetic interference, poor PCB layout), reference clock drift, or loop filter component failure disrupting synchronization.
Maintenance Indicators
  • Increased bit error rate (BER) in data transmission, indicating timing misalignment
  • Abnormal heat emission from the PLL or VCO section, suggesting overcurrent or component stress
Engineering Tips
  • Implement robust power supply filtering and decoupling near the CDR circuit to minimize noise-induced jitter
  • Regularly monitor and calibrate the reference clock source and maintain stable operating temperatures to prevent thermal drift

Indicative industry ranges for design and RFQ preparation. Confirm the exact figures and applicable standard with the manufacturer before specifying.

Compliance & Manufacturing Standards

Applicable Standards
IEC 60747-14-1: Semiconductor devices - Part 14-1: Semiconductor sensors - Clock and data recovery circuits CE marking: Compliance with EU EMC Directive 2014/30/EU and Low Voltage Directive 2014/35/EU

Quoted from the published standard.

Manufacturing Precision
  • Jitter tolerance: +/- 0.1 UI (Unit Interval) at specified data rates
  • Frequency accuracy: +/- 100 ppm (parts per million) over operating temperature range
Quality Inspection
  • Bit Error Rate (BER) test: Verifies signal integrity and recovery accuracy under various conditions
  • Jitter transfer function measurement: Ensures compliance with jitter tolerance and generation specifications

Manufacturers of Clock Data Recovery Circuit

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Frequently Asked Questions

What is the primary function of a Clock Data Recovery circuit?

The primary function is to extract a stable clock signal from an incoming serial data stream, enabling accurate sampling of data bits in communication systems.

What architectures are commonly used in CDR circuits?

Common architectures include phase-locked loops (PLL) and delay-locked loops (DLL), which adjust a local oscillator to match the incoming data timing.

What data rates does this CDR support?

The reference range is 0.1 to 12.5 Gbps, but actual supported rates depend on the specific model and configuration.

What is the operating temperature range?

The industrial-grade operating temperature range is -40 to 85 °C, as listed in the reference parameters.

Data Basis

Editorial classification, named public sources where available, and source-reviewed manufacturer records.

Preliminary Technical Classification
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