Products (10)
Product
in Computer, Electronic and Optical Product Manufacturing
A precisely arranged set of spring-loaded electrical probes used to establish temporary electrical connections with test points on electronic devices or printed circuit boards (PCBs) during automat...
Product
in Computer, Electronic and Optical Product Manufacturing
A precision interface component used to establish electrical contact with microfluidic chips or cell sorting cartridges for signal transmission and testing.
Product
in Computer, Electronic and Optical Product Manufacturing
A precisely arranged collection of electrical contact probes used for automated testing of electronic circuits and components.
Product
in Computer, Electronic and Optical Product Manufacturing
A structural and electrical interface component that provides mechanical support and electrical connectivity for test probes within a test probe assembly.
Product
in Computer, Electronic and Optical Product Manufacturing
An interface component in wafer testing that establishes electrical connections between test equipment and semiconductor wafer dies.
Product
in Computer, Electronic and Optical Product Manufacturing
Electrical and mechanical interface connecting the probe card to the test head/controller in semiconductor testing equipment
Product
in Computer, Electronic and Optical Product Manufacturing
Structural components within a test probe fixture that provide secure mounting points for electrical test probes.
Product
in Computer, Electronic and Optical Product Manufacturing
Electrical interface connecting the oscilloscope to the circuit under test.
Product
in Computer, Electronic and Optical Product Manufacturing
A critical component in probe cards that redistributes electrical signals from the tester's pitch to the device-under-test's finer pitch.
Product
in Computer, Electronic and Optical Product Manufacturing
A critical component of a wafer prober that provides the electrical and mechanical interface between the prober's test electronics and the semiconductor wafer under test.