Electrical Test Fixture/Probes for Automated Cell Sorting

Product Specifications

Technical details and manufacturing context for Electrical Test Fixture/Probes

Definition

Within an Automated Cell Sorting Station, the Electrical Test Fixture/Probes serve as the critical interface for electrical connectivity. They physically and electrically connect the station's control and analysis systems to the disposable microfluidic chip or cartridge that contains the cell sample. This enables the application of electrical signals for cell manipulation (e.g., dielectrophoresis) and the measurement of impedance or other electrical properties for cell identification and sorting validation. The fixture precisely aligns and holds the microfluidic chip, while spring-loaded or micromanipulated conductive probes, often made of gold-plated tungsten or beryllium copper, extend to make contact with specific electrode pads on the chip. This creates a closed electrical circuit, allowing the station to deliver controlled voltages/currents for cell actuation and to receive sensor feedback signals from the chip. The probes are designed to maintain low contact resistance (≤50 mΩ) to ensure signal integrity, and high insulation resistance (≥1000 MΩ) to prevent leakage. They can withstand a dielectric withstanding voltage of 500 V AC for 1 minute without breakdown. Each contact supports a continuous current rating of 1–5 A. The operating temperature range is -40 to 85°C, with extended ranges available. Probe tip diameters range from 0.5 to 1.5 mm to match pad sizes, and probe lengths from 10 to 50 mm, with custom lengths available. Spring force is 0.5–2.0 N at 50% compression, and cycle life is 100,000–500,000 cycles. Materials include beryllium copper, gold-plated tungsten, PEEK, and stainless steel. Insulation materials include PTFE and PEEK. Weight ranges from 50 to 200 g depending on configuration. These values are reference ranges and must be verified for the specific model and application with the legal manufacturer or supplier.

Working Principle

The fixture precisely aligns and holds a microfluidic chip. Spring-loaded or micromanipulated conductive probes (often made of gold-plated tungsten or beryllium copper) extend from the fixture to make contact with specific electrode pads on the chip. This creates a closed electrical circuit, allowing the station to deliver controlled voltages/currents for cell actuation and to receive sensor feedback signals from the chip.

Common Materials

Beryllium Copper, Gold-Plated Tungsten, PEEK (Polyether Ether Ketone), Stainless Steel

Technical Parameters

Parameter	Typical range	Notes & selection driver
Contact Resistance	≤50 mΩ	Lower resistance ensures signal integrity.
Insulation Resistance	≥1000 MΩ	At 500 V DC, prevents leakage.
Dielectric Withstanding Voltage	500 V AC	1 minute, no breakdown.
Current Rating	1–5 A	Per contact, continuous.
Operating Temperature	-40–85 °C	Extended range available.
Probe Tip Diameter	0.5–1.5 mm	Matches pad size.
Probe Length	10–50 mm	Custom lengths available.
Spring Force	0.5–2.0 N	At 50% compression.
Cycle Life	100000–500000 cycles	Mechanical endurance.
Material	BeCu, Au-plated	Tip: tungsten or steel.
Insulation Material	PTFE, PEEK	High dielectric strength.
Weight	50–200 g	Depends on configuration.

Ranges are indicative industry figures for RFQ preparation, not a supplier commitment. Confirm every value and standard with the legal manufacturer before ordering.

Components / BOM

Probe Pin Part
The conductive needle that makes physical and electrical contact with the chip's electrode pad.

Material: Gold-Plated Tungsten or Beryllium Copper
Spring Mechanism Part
Provides the compliant force behind each probe pin to maintain consistent contact pressure and compensate for minor surface variations.

Material: Stainless Steel
Guide Plate Part
A precision-machined plate with holes that align and guide each probe pin, ensuring accurate positioning.

Material: PEEK or Ceramic
Fixture Body/Housing Part
The main structural frame that holds all components, provides mounting points to the sorter, and houses electrical connectors.

Material: Aluminum or Stainless Steel

Applied To / Applications

This component is essential for the following industrial systems and equipment:

Automated Cell Sorting Station

View system integration details

Manufacturers of Electrical Test Fixture/Probes

Manufacturer profiles associated with Electrical Test Fixture/Probes.

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Frequently Asked Questions

What is the primary function of the Electrical Test Fixture/Probes?

They establish electrical contact between the control/analysis systems of an Automated Cell Sorting Station and the disposable microfluidic chip or cartridge, enabling signal transmission for cell manipulation and measurement.

What materials are used for the probes?

Probes are often made of gold-plated tungsten or beryllium copper, with insulation materials like PTFE and PEEK. The fixture may also use stainless steel and PEEK.

What are the key electrical parameters?

Contact resistance is ≤50 mΩ, insulation resistance ≥1000 MΩ, dielectric withstanding voltage 500 V AC, and current rating 1–5 A per contact. These are reference ranges; verify for your model.

How should I verify the suitability of these probes for my application?

Check the specific model's datasheet for exact values of contact resistance, insulation, temperature range, and mechanical endurance. Confirm with the legal manufacturer or supplier.

Data Basis

Editorial classification, named public sources where available, and source-reviewed manufacturer records.

Preliminary Technical Classification

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pressure:	0 to 30 psi
other spec:	Contact resistance < 50 mΩ, Signal frequency up to 1 GHz
temperature:	-20°C to +85°C

Electrical Test Fixture/Probes

Product Specifications

Applied To / Applications

Industrial Ecosystem & Supply Chain Structure

Application Fit & Sizing Matrix

Reliability & Engineering Risk Analysis

Compliance & Manufacturing Standards