Editorial Technical Reference

Interconnection matrix

This page explains how Interconnection matrix is classified within Computer, Electronic and Optical Product Manufacturing. Technical values and manufacturer relationships are research references; confirm the current specification and supplier evidence for each order.

Technical Definition & Core Assembly

A structured network of electrical connections that routes signals between individual photodetectors in an array.

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Product Specifications

Technical details and manufacturing context for Interconnection matrix

Definition
The interconnection matrix is a critical electrical infrastructure within a photodetector array. It establishes conductive pathways between discrete photodetector elements, enabling signal transmission from each detector to processing circuitry. This facilitates coordinated data collection and spatial resolution across the array. The matrix consists of patterned conductive traces, typically on a substrate, that physically and electrically link the output terminals of individual photodetectors to common output buses or dedicated readout channels. When a photodetector generates an electrical signal in response to light, the signal travels through the corresponding trace to reach external amplification and processing systems. The matrix supports arrays with 8 to 64 input/output channels, determining array size and routing capacity. It operates within a temperature range of -40 to 85 °C, beyond which signal integrity degrades. Insertion loss is kept at or below 0.5 dB for signal fidelity, and crosstalk isolation is at least 60 dB to prevent interference between channels. The bandwidth spans DC to 10 GHz, supporting high-speed photodetector signals. Contact resistance is limited to 50 mΩ or less to minimize signal loss, and insulation resistance is at least 1000 MΩ at 500 V DC for electrical safety. The matrix withstands 500 V DC for one minute without breakdown. Operating humidity ranges from 5% to 95% RH (non-condensing), with high humidity potentially causing corrosion. Ingress protection is rated IP54 to IP65 per IEC 60529, protecting against dust and water jets. Connector types include SMA to 2.92, compatible with standard RF connectors. Dimensions are 100×80×20 mm, and weight is 200 g or less. Materials on file include copper, aluminum, gold, and polyimide substrate. These specifications are reference ranges; verify model-specific values with the manufacturer.
Working Principle
The interconnection matrix uses patterned conductive traces on a substrate to connect photodetector outputs to readout channels. When light strikes a photodetector, it generates an electrical signal that travels through the corresponding trace to external processing systems. The matrix ensures each detector's signal is routed without interference, maintaining signal integrity across the array.
Common Materials
Copper, Aluminum, Gold, Polyimide substrate
Technical Parameters
ParameterTypical rangeNotes & selection driver
Number of Inputs/Outputs8–64 channelsDetermines array size and routing capacity
Operating Temperature-40–85 °CBeyond this range, signal integrity degrades
Insertion Loss≤0.5 dBLower is better for signal fidelity
Crosstalk Isolation≥60 dBPrevents signal interference between channels
BandwidthDC–10 GHzSupports high-speed photodetector signals
Contact Resistance≤50 Low resistance ensures minimal signal loss
Insulation Resistance≥1000 At 500 V DC; ensures electrical safety
Dielectric Withstanding Voltage500 V DCWithstands 500 V for 1 minute without breakdown
Operating Humidity5–95 % RHNon-condensing; high humidity may cause corrosion
Ingress ProtectionIP54–IP65Protects against dust and water jetsIEC 60529
Connector TypeSMA–2.92Compatible with standard RF connectors
Dimensions100×80×20 mmCompact footprint for integration
Weight≤200 gLightweight for portable equipment

Ranges are indicative industry figures for RFQ preparation, not a supplier commitment. Confirm every value and standard with the legal manufacturer before ordering.

Components / BOM
  • Conductive Trace Part
    Carries electrical signals from photodetectors
    Material: Copper or aluminum
  • Dielectric Layer Part
    Electrically isolates adjacent traces to prevent short circuits
    Material: Polyimide or silicon dioxide
  • Contact Pad Part
    Provides electrical connection point for photodetector bonding
    Material: Gold or aluminum

Applied To / Applications

This component is essential for the following industrial systems and equipment:

Industrial Ecosystem & Supply Chain Structure

Complementary Systems
Downstream Applications
Specialized Tooling

Application Fit & Sizing Matrix

Operational Limits
pressure: Atmospheric to 1.5 bar
other spec: Signal frequency range: DC to 10 GHz, Crosstalk: < -40 dB
temperature: -40°C to +85°C
Media Compatibility
✓ Clean room air environments ✓ Vacuum-sealed optical assemblies ✓ Dry nitrogen atmospheres
Unsuitable: High-humidity or corrosive chemical environments
Sizing Data Required
  • Number of photodetectors in array
  • Signal bandwidth requirements
  • Physical spacing constraints between detectors

Reliability & Engineering Risk Analysis

Failure Mode & Root Cause
Contact pitting and fretting corrosion
Cause: Micro-motion between mated connectors due to vibration or thermal cycling, leading to oxidation and increased electrical resistance
Insulation breakdown and short-circuiting
Cause: Contaminant ingress (moisture, dust, oils) combined with electrical stress, causing dielectric failure and arcing
Maintenance Indicators
  • Intermittent signal loss or erratic system behavior indicating unstable electrical connections
  • Visible discoloration, corrosion, or overheating signs (melting/burning) on connector housings
Engineering Tips
  • Implement periodic torque verification on all mechanical fasteners to maintain proper contact pressure and prevent fretting
  • Apply appropriate environmental sealing (gaskets, potting, or conformal coatings) based on operating conditions to prevent contaminant ingress

Indicative industry ranges for design and RFQ preparation. Confirm the exact figures and applicable standard with the manufacturer before specifying.

Compliance & Manufacturing Standards

Applicable Standards
DIN EN 60529 - Degrees of protection provided by enclosures (IP Code)

Quoted from the published standard.

Manufacturing Precision
  • Connector alignment: +/-0.05mm
  • Contact resistance: +/-5% of nominal value
Quality Inspection
  • Continuity testing - Electrical connectivity verification
  • Visual inspection for physical defects and proper assembly

Manufacturers of Interconnection matrix

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Frequently Asked Questions

What is the role of the interconnection matrix in a photodetector array?

The interconnection matrix provides the electrical pathways that connect individual photodetectors to readout circuitry, enabling signal transmission and spatial resolution across the array.

What are the key electrical specifications to verify?

Key specifications include insertion loss (≤0.5 dB), crosstalk isolation (≥60 dB), bandwidth (DC–10 GHz), contact resistance (≤50 mΩ), and insulation resistance (≥1000 MΩ at 500 V DC). Always confirm these values for your specific model.

What environmental conditions can the matrix withstand?

It operates from -40 to 85 °C, 5–95% RH non-condensing, and has ingress protection IP54–IP65 per IEC 60529. High humidity may cause corrosion, so verify suitability for your environment.

How should I verify compliance with standards?

The ingress protection rating references IEC 60529, but this is a procurement reference. Confirm with the manufacturer that the specific model meets your required standards and performance parameters.

Data Basis

Editorial classification, named public sources where available, and source-reviewed manufacturer records.

Preliminary Technical Classification
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