Editorial Technical Reference

Sample-and-Hold (S/H) Circuit

This page explains how Sample-and-Hold (S/H) Circuit is classified within Computer, Electronic and Optical Product Manufacturing. Technical values and manufacturer relationships are research references; confirm the current specification and supplier evidence for each order.

Technical Definition & Core Assembly

An electronic circuit that samples an analog signal at a specific instant and holds that value constant for subsequent processing.

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Product Specifications

Technical details and manufacturing context for Sample-and-Hold (S/H) Circuit

Definition
A sample-and-hold (S/H) circuit is a component used in analog-to-digital conversion (ADC) systems. It captures the instantaneous voltage of a continuous analog signal at a precise moment and maintains that voltage stable during the conversion process, preventing errors caused by signal changes. The circuit operates in two phases: during the sample phase, a switch closes, allowing the input voltage to charge a hold capacitor; during the hold phase, the switch opens, isolating the capacitor and preserving the sampled voltage. This ensures that the ADC receives a constant input, improving accuracy. The S/H circuit is critical in data acquisition systems, instrumentation, and communication equipment. It is typically implemented using CMOS or bipolar semiconductor technology, with a polymer capacitor for charge storage and a ceramic substrate for mounting. Key parameters include supply voltage (5 V DC ±10%), supply current (2–10 mA), input and output voltage ranges (0–5 V), acquisition time (1–10 µs), aperture delay (10–50 ns), aperture jitter (1–5 ps), droop rate (0.1–1 mV/ms), settling time (2–20 µs), input offset voltage (±0.5 to ±5 mV), and gain error (±0.01% to ±0.1%). Operating temperature range is -40 to 85 °C, storage range -55 to 125 °C, and typical package is SOIC-8. These values are reference ranges and must be verified for the specific model and application. Standards such as IEC 60721-3-1 and JEDEC MS-012 are referenced for environmental and packaging considerations, but do not imply certification. Always consult the manufacturer for exact specifications and compliance.
Working Principle
The S/H circuit operates in two phases. In the sample phase, the control signal closes the switch, connecting the input to the hold capacitor. The capacitor charges to the input voltage, following the analog signal. In the hold phase, the switch opens, disconnecting the input. The capacitor retains its charge, maintaining the voltage at the last sampled value. This held voltage is then presented to the ADC for conversion. The switch is typically a CMOS transistor, and the capacitor is a high-quality polymer type to minimize leakage. The aperture delay is the time between the hold command and the actual opening of the switch, and aperture jitter is the uncertainty in that delay. During hold, the voltage may droop due to capacitor leakage, characterized by the droop rate. The acquisition time is the time needed for the capacitor to charge to the input voltage within a specified accuracy. The settling time is the time for the output to stabilize after acquisition. These parameters determine the circuit's performance and suitability for specific sampling rates and accuracy requirements.
Common Materials
Semiconductor (CMOS/Bipolar), Polymer capacitor, Ceramic substrate
Technical Parameters
ParameterTypical rangeNotes & selection driver
Supply Voltage5 ±10% V DCOperating range for analog and digital sections
Supply Current2–10 mADepends on output load and sampling rate
Input Voltage Range0–5 VWithin supply rails; beyond may cause clipping
Output Voltage Range0–5 VHolds last sampled value
Acquisition Time1–10 µsTime to settle to 0.01% of final value
Aperture Delay10–50 nsDelay from hold command to actual sampling
Aperture Jitter1–5 psUncertainty in aperture delay
Droop Rate0.1–1 mV/msVoltage decay in hold mode
Settling Time2–20 µsTo 0.01% after acquisition
Input Offset Voltage±0.5–±5 mVAffects accuracy
Gain Error±0.01–±0.1 %Full-scale error
Operating Temperature Range-40–85 °CExtended range availableIEC 60721-3-1
Storage Temperature Range-55–125 °CNon-operatingIEC 60721-3-1
Package TypeSOIC-8Other packages availableJEDEC MS-012

Ranges are indicative industry figures for RFQ preparation, not a supplier commitment. Confirm every value and standard with the legal manufacturer before ordering.

Components / BOM
  • Analog Switch Part
    Controls connection between input signal and hold capacitor
    Material: CMOS/Bipolar semiconductor
  • Hold Capacitor Part
    Stores sampled analog voltage during hold phase
    Material: Polymer/ceramic dielectric
  • Buffer Amplifier
    Isolates hold capacitor from loading effects and provides low-impedance output
    Material: Semiconductor (op-amp circuitry)

Applied To / Applications

This component is essential for the following industrial systems and equipment:

Industrial Ecosystem & Supply Chain Structure

Complementary Systems
Downstream Applications
Specialized Tooling

Application Fit & Sizing Matrix

Operational Limits
pressure: Not applicable (electronic circuit, no fluid/gas pressure)
other spec: Sampling rate: up to 100 MS/s (mega-samples per second) for high-speed versions, Hold time: typically 1 µs to 100 ms depending on capacitor and leakage
temperature: -40°C to +125°C (operational range for typical IC implementations)
Media Compatibility
✓ Analog voltage signals (0-5V range) ✓ Low-frequency sensor outputs (temperature, pressure transducers) ✓ Audio signal processing applications
Unsuitable: High-frequency RF signals above 100 MHz (due to sampling limitations and aperture uncertainty)
Sizing Data Required
  • Maximum input signal frequency (to determine required sampling rate)
  • Required hold time duration (to determine capacitor size and leakage specifications)
  • Signal voltage range and accuracy requirements (to determine resolution and linearity needs)

Reliability & Engineering Risk Analysis

Failure Mode & Root Cause
Hold capacitor leakage or degradation
Cause: Capacitor aging, dielectric breakdown, or contamination leading to charge loss and signal droop during hold phase
Switch transistor failure or degradation
Cause: Overvoltage stress, electrostatic discharge (ESD), thermal cycling, or oxide breakdown in MOSFET/BJT switches causing increased on-resistance or stuck states
Maintenance Indicators
  • Audible high-frequency oscillation or ringing in output signal during acquisition phase
  • Visual distortion on oscilloscope showing signal droop, drift, or step changes during hold phase
Engineering Tips
  • Implement periodic calibration and testing of hold capacitor integrity using precision charge/discharge measurements to detect early degradation
  • Use ESD protection circuits and thermal management (heat sinks, derating) for switch transistors, and select components with voltage ratings 50% above maximum operating conditions

Indicative industry ranges for design and RFQ preparation. Confirm the exact figures and applicable standard with the manufacturer before specifying.

Compliance & Manufacturing Standards

Applicable Standards
IEC 61000-4-4 - Electrical fast transient/burst immunity CE Marking - EMC Directive 2014/30/EU

Quoted from the published standard.

Manufacturing Precision
  • Hold capacitor value: +/-5%
  • Aperture time: +/-0.5ns
Quality Inspection
  • Signal integrity test (SINAD/THD)
  • Temperature cycling test (-40°C to +85°C)

Manufacturers of Sample-and-Hold (S/H) Circuit

Manufacturer profiles associated with Sample-and-Hold (S/H) Circuit.

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Frequently Asked Questions

What is the purpose of a sample-and-hold circuit?

It captures an analog voltage at a specific instant and holds it constant during analog-to-digital conversion, preventing errors due to signal changes.

What are the key parameters to consider when selecting a sample-and-hold circuit?

Important parameters include acquisition time, aperture delay, aperture jitter, droop rate, settling time, input offset voltage, and gain error. These affect accuracy and speed.

How does the hold capacitor affect performance?

The capacitor's quality determines droop rate and acquisition time. A low-leakage capacitor reduces droop, while a larger capacitance may increase acquisition time.

What standards apply to sample-and-hold circuits?

Environmental and packaging standards such as IEC 60721-3-1 and JEDEC MS-012 may be referenced, but compliance must be verified with the manufacturer.

Data Basis

Editorial classification, named public sources where available, and source-reviewed manufacturer records.

Preliminary Technical Classification
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