A precision contact probe used in coordinate measuring machines (CMMs) for dimensional inspection and quality control in manufacturing.
| Parameter | Typical range | Notes & selection driver |
|---|---|---|
| Repeatability | 0.1μm to 0.5μm | |
| Trigger Force | 0.1N to 1.0N | |
| Stylus Tip Diameter | 0.3mm to 8mm | |
| Connection Interface | M2, M3, or proprietary mounting systems | |
| Operating Temperature | 15°C to 30°C | |
| Maximum Approach Speed | 10mm/s to 50mm/s | |
| Maximum Permissible Error (MPE) | ±0.5μm to ±2.5μm |
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This component is used in the following industrial products
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Contact probes physically touch the workpiece with a stylus, providing high accuracy for hard materials with defined surfaces. Non-contact probes (like laser or vision systems) measure without physical contact, suitable for delicate or soft materials but may have different accuracy characteristics.
Contact probes should be calibrated daily or before critical measurements using a reference sphere. Full performance verification should follow manufacturer recommendations, typically every 6-12 months or according to ISO 10360 standards.
Yes, with appropriate selection. Low-force probes (0.1N-0.3N) with larger tip diameters can minimize surface deformation. For very delicate materials, non-contact methods might be preferable to avoid any marking or damage.
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