Products (10)
Product
in Computer, Electronic and Optical Product Manufacturing
A robotic system that automatically sorts, tests, and classifies semiconductor devices during production.
Product
in Computer, Electronic and Optical Product Manufacturing
Electronic interface cards that provide signal generation, measurement, and switching capabilities for testing semiconductor devices in automated test equipment.
Product
in Computer, Electronic and Optical Product Manufacturing
An interface component in wafer testing that establishes electrical connections between test equipment and semiconductor wafer dies.
Product
in Computer, Electronic and Optical Product Manufacturing
Electrical and mechanical interface connecting the probe card to the test head/controller in semiconductor testing equipment
Product
in Computer, Electronic and Optical Product Manufacturing
A specialized circuit board within a probe card interface that transmits electrical signals between the test equipment and semiconductor wafer during testing.
Product
in Computer, Electronic and Optical Product Manufacturing
A critical component of a wafer prober that provides the electrical and mechanical interface between the prober's test electronics and the semiconductor wafer under test.
Product
in Computer, Electronic and Optical Product Manufacturing
A precision interface component in automated test handlers that provides electrical and mechanical connection between test equipment and semiconductor devices under test.
Product
in Computer, Electronic and Optical Product Manufacturing
A temperature-controlled platform in a wafer prober that holds and regulates the temperature of semiconductor wafers during electrical testing.
Product
in Computer, Electronic and Optical Product Manufacturing
A precision vacuum or electrostatic holding device that secures semiconductor wafers during testing in wafer probers.
Product
in Computer, Electronic and Optical Product Manufacturing
A semiconductor testing instrument that makes electrical contact with integrated circuits on a wafer for performance verification.