Editorial Technical Reference

Automated test handler (semiconductor)

Semiconductor test handlers · pick-and-place, gravity-feed, turret and memory handlers that carry packaged ICs to the tester, hold them at temperature and sort them by result, with throughput (UPH), parallel test sites, tri-temperature range, package range and conversion time

An automated test handler is the machine that feeds packaged chips to automatic test equipment (ATE) during final test. It picks devices from trays, tubes or bulk, places them in test contactors at a set temperature, and sorts them into bins by test result. Ask three things first: which packages and sizes it must handle, how many devices must be tested in parallel at what throughput, and over what temperature range.

Test handlers for final test of packaged semiconductors: pick-and-place, gravity-feed, turret and memory handlers, with thermal options and change kits. Wafer probers, the testers (ATE) themselves and contactors sold alone are outside this page except where compared.

CNFX editorial research · Sources checked October 12, 2026 · 6 sources

01

Choose the handler type

Advantest, a test equipment maker, describes a test handler as equipment that automates the final testing of semiconductor devices. It transports devices, controls temperature during testing and sorts devices based on test results. Advantest lists SoC test handlers and memory test handlers, with change kits for different devices. [1]

Cohu, another maker, lists pick-and-place, gravity-feed and test-in-strip handlers, MEMS test cells, and turret-based test handling and back-end finishing equipment for ICs, LEDs and discrete components. Its handlers cover automotive, mobile, power, MEMS and microcontroller devices. It highlights temperature control with sensors embedded in individual contactors for closed-loop control, and active thermal control that removes heat from devices during test. [4]

Give the supplier the device packages and sizes (for example BGA, QFN, SO, QFP), the input and output media (tray, tube, bulk, strip), the tester and interface, the number of parallel test sites, the throughput target at your test time, the temperature range and accuracy, the sort bins, conversion time between products, the floor space and the factory communication protocol.

02

Size throughput, parallelism and temperature

Published examples show the range. The table compares four handlers from the makers' own pages. [5] [6] [2] [3]

Package range and changeover vary by type. The MT9510 handles packages from 3 × 3 mm to 70 × 70 mm, up to 22 mm thick, with package conversion in about 15 minutes. The gravity-feed MT9928 xm takes MSOP 118 mil to SO 430 mil and QFN 2–11 mm with lead pitch down to 0.4 mm, from tube, metal magazine or bulk, with kit conversion in about 1 hour. [5] [6]

Editorial calculation: 3,600 s ÷ 5,300 UPH ≈ 0.68 s per device and 3,600 s ÷ 42,200 UPH ≈ 0.085 s per device. Cohu states its MT9928 figure at zero test time; ask for throughput at your own test time and parallelism.

Throughput figures depend on the test time and parallelism behind them. Advantest states the M4841's 18,500 devices per hour with 16-device parallel test at a test time of 3 seconds or less, while Cohu states the MT9928 xm figure at zero test time. Editorial calculation: 18,500 devices per hour is about 5.1 devices per second, or one 16-device batch about every 3.1 seconds. Ask each maker to restate throughput for your own test time, site count and package, so the figures can be compared directly. [2] [6]

HandlerTypeThroughputParallel / temperature
Cohu MT9510Pick-and-placeUp to 5,300 UPH; index 0.38 s (XP) and 0.65 s (x16) [5]x1–x16; −55 to +175 °C tri-temp [5]
Cohu MT9928 xmGravity feedUp to 28,000 UPH at zero test time [6]Up to 8 sites; −55 to +175 °C, ±2 °C [6]
Advantest M4841SoC (MCU, DSP)18,500 devices per hour [2]Up to 32 devices; −40 to +125 °C (−55 to +175 °C option) [2]
Advantest M6242Memory (DRAM)42,200 devices per hour [3]±1.5 °C accuracy at −10 to 100 °C [3]

03

Check the main components

ComponentRoleFix in the order
Input and outputDevice supply and unloading by tray, tube, metal magazine or bowl/bulk. [6] [5]Media for your packages; tray thickness.
Transport and plungerMoves devices to the test site and back; pick-and-place, gravity or turret. [1] [4]Handler type and index time.
Thermal systemControls device temperature during test; sensors in contactors for closed-loop control; active thermal control removes heat. [1] [4]Temperature range and accuracy.
Change kitDevice-specific parts changed for a new package. [1] [6]Kit cost and conversion time.
Sorting and binningSorts devices by test result. [1]Number of bins and bin media.

04

Five handler figures that set the price

Each row pairs a Cohu or Advantest figure with the question to put to the supplier; throughput figures only compare once restated at your own test time and site count.

FieldWhat it means and published valuesAsk the supplier for
Handler typePick-and-place, gravity feed, turret, memory. [4] [1]Type for your packages.
ThroughputExamples: 5,300; 18,500; 28,000; 42,200 UPH. [5] [2] [6] [3]UPH at your test time.
Parallel sitesExamples: x16; 8 sites; 32 devices. [5] [6] [2]Sites for your tester.
TemperatureExamples: −55 to +175 °C; ±2 °C; ±1.5 °C. [6] [3]Range and accuracy.
PackagesExamples: 3×3–70×70 mm; QFN 2–11 mm. [5] [6]Change kits; conversion time.

05

Send the package, tester and throughput data together

Paste it into your enquiry below or into an email to a maker, then replace every bracket.

Packages: [type; size; thickness; pitch]
Media: [tray; tube; bulk; strip]
Tester: [make; interface; sites]
Throughput: [UPH target; test time]
Temperature: [range; accuracy; tri-temp]
Sort: [bins]
Factory: [SECS/GEM; footprint]

See manufacturer records Send an enquiry through CNFX

Find automated test handler manufacturers

Hangzhou Changchuan Technology Co., Ltd. lists pick-and-place, gravity and turret test handlers on its website.

Hangzhou Changchuan Technology Co., Ltd.
Manufacturing site to be confirmed for the order

Its website lists test handlers, including pick-and-place, gravity and turret types.

Product scope checked 2026-10-12

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Product page on own website · profile compiled by CNFX from public sources

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Buyer questions

What does a test handler do?

Advantest says it automates final testing by transporting devices, controlling their temperature during test and sorting them by result. [1]

How fast are test handlers?

Published examples run from 5,300 UPH (Cohu MT9510 pick-and-place) to 42,200 devices per hour (Advantest M6242 memory handler). [5] [3]

What temperature range do handlers cover?

Tri-temperature handlers such as Cohu's MT9510 and MT9928 xm list −55 to +175 °C. [5] [6]

Why do handler throughput figures differ so much?

Makers state them at different test times and site counts: Advantest's M4841 at 3 s or less with 16 devices in parallel, Cohu's MT9928 xm at zero test time. [2] [6]

Sources and what still needs a direct check

Sources checked 2026-10-12. Cohu and Advantest describe their own handlers; their figures are examples, not limits.

  1. Advantest — Test handler overview ↗ Maker product page Return to text ↑
  2. Advantest — M4841 test handler ↗ Maker product page Return to text ↑
  3. Advantest — M6242/M6243 memory test handler ↗ Maker product page Return to text ↑
  4. Cohu — Test handlers ↗ Maker product page Return to text ↑
  5. Cohu — MT9510 pick-and-place handler ↗ Maker product page Return to text ↑
  6. Cohu — MT9928 xm gravity handler ↗ Maker product page Return to text ↑

Still to check yourself

  • List packages and media.
  • Set sites and throughput.
  • Specify temperature range.
  • Check conversion time.
  • Verify the legal supplier and factory.
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