Automated Test Equipment
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This page explains how Handler / Prober (for component ATE) is classified within Computer, Electronic and Optical Product Manufacturing. Technical values and manufacturer relationships are research references; confirm the current specification and supplier evidence for each order.
A Handler/Prober is a specialized component within Automated Test Equipment (ATE) that precisely positions electronic components or wafers and establishes electrical contact for testing.
Technical details and manufacturing context for Handler / Prober (for component ATE)
| Parameter | Typical range | Notes & selection driver |
|---|---|---|
| Test Temperature Range | -40–150 °C | For hot/cold testing; outside this range requires special options |
| Temperature Accuracy | ±1 °C | At chuck surface; critical for device characterization |
| Positioning Accuracy | ±0.01 mm | For probe placement; affects test yield |
| Throughput | 1000–5000 pcs/h | Depends on device size and test time |
| Input Voltage | 220 ±10% V AC | Single phase; other voltages on request |
| Power Consumption | 1.5–3.0 kW | Including temperature control |
| Compressed Air Supply | 0.4–0.6 MPa | For pneumatic actuators |
| Humidity Range | 20–80 % RH | Non-condensing; higher humidity may cause corrosion |
| Ingress Protection | IP20–IP54 | Higher IP for harsh environmentsIEC 60529 |
| Machine Weight | 500–1500 kg | Depends on configuration |
| Footprint (W×D×H) | 1200×1000×1800 mm | Approximate; varies with options |
Ranges are indicative industry figures for RFQ preparation, not a supplier commitment. Confirm every value and standard with the legal manufacturer before ordering.
| pressure: | Up to 100 psi (contact force/pneumatic system) |
| other spec: | Throughput: 500-10,000 UPH (units per hour), Accuracy: ±25 μm positioning |
| temperature: | -40°C to +125°C (component test temperature range) |
Indicative industry ranges for design and RFQ preparation. Confirm the exact figures and applicable standard with the manufacturer before specifying.
Quoted from the published standard.
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A handler is designed to handle packaged components or devices, managing loading, positioning, and sorting. A prober is used for wafer-level testing, positioning test probes on semiconductor wafers. Both establish electrical contact for testing within an ATE system.
The standard test temperature range is -40 to 150 °C. Outside this range, special options may be required. Temperature accuracy is ±1 °C at the chuck surface, which is critical for device characterization.
The equipment requires a single-phase 220 V AC (±10%) power supply, with power consumption between 1.5 and 3.0 kW including temperature control. Compressed air supply of 0.4–0.6 MPa is needed for pneumatic actuators.
The equipment should operate in non-condensing humidity between 20% and 80% RH. Higher humidity may cause corrosion. The ingress protection rating is IP20–IP54 per IEC 60529, with higher ratings for harsh environments.
This component is essential for the following industrial systems and equipment:
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