Automated Test Equipment
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This page explains how Handler / Prober (for component ATE) is classified within Computer, Electronic and Optical Product Manufacturing. Technical values and manufacturer relationships are research references; confirm the current specification and supplier evidence for each order.
A Handler/Prober is a specialized component within Automated Test Equipment (ATE) that precisely positions electronic components or wafers and establishes electrical contact for testing.
Technical details and manufacturing context for Handler / Prober (for component ATE)
| Parameter | Typical range | Notes & selection driver |
|---|---|---|
| Test Temperature Range | -40–150 °C | For hot/cold testing; outside this range requires special options |
| Temperature Accuracy | ±1 °C | At chuck surface; critical for device characterization |
| Positioning Accuracy | ±0.01 mm | For probe placement; affects test yield |
| Throughput | 1000–5000 pcs/h | Depends on device size and test time |
| Input Voltage | 220 ±10% V AC | Single phase; other voltages on request |
| Power Consumption | 1.5–3.0 kW | Including temperature control |
| Compressed Air Supply | 0.4–0.6 MPa | For pneumatic actuators |
| Humidity Range | 20–80 % RH | Non-condensing; higher humidity may cause corrosion |
| Ingress Protection | IP20–IP54 | Higher IP for harsh environmentsIEC 60529 |
| Machine Weight | 500–1500 kg | Depends on configuration |
| Footprint (W×D×H) | 1200×1000×1800 mm | Approximate; varies with options |
Ranges are indicative industry figures for RFQ preparation, not a supplier commitment. Confirm every value and standard with the legal manufacturer before ordering.
Commonly used trade names and technical identifiers for Handler / Prober (for component ATE).
This component is essential for the following industrial systems and equipment:
| pressure: | Up to 100 psi (contact force/pneumatic system) |
| other spec: | Throughput: 500-10,000 UPH (units per hour), Accuracy: ±25 μm positioning |
| temperature: | -40°C to +125°C (component test temperature range) |
Indicative industry ranges for design and RFQ preparation. Confirm the exact figures and applicable standard with the manufacturer before specifying.
Quoted from the published standard.
Manufacturer profiles associated with Handler / Prober (for component ATE).
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A practical evidence checklist for RFQ preparation and supplier evaluation.
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A handler is designed to handle packaged components or devices, managing loading, positioning, and sorting. A prober is used for wafer-level testing, positioning test probes on semiconductor wafers. Both establish electrical contact for testing within an ATE system.
The standard test temperature range is -40 to 150 °C. Outside this range, special options may be required. Temperature accuracy is ±1 °C at the chuck surface, which is critical for device characterization.
The equipment requires a single-phase 220 V AC (±10%) power supply, with power consumption between 1.5 and 3.0 kW including temperature control. Compressed air supply of 0.4–0.6 MPa is needed for pneumatic actuators.
The equipment should operate in non-condensing humidity between 20% and 80% RH. Higher humidity may cause corrosion. The ingress protection rating is IP20–IP54 per IEC 60529, with higher ratings for harsh environments.
Editorial classification, named public sources where available, and source-reviewed manufacturer records.
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